Testing of deep-submicron battery-operated circuits using new fast current monitoring scheme

2002 ◽  
Author(s):  
M. Margala ◽  
I. Pecuh
Keyword(s):  
Deep Submicron ◽  
Monitoring Scheme ◽  
Current Monitoring

Confidentiality of Statistical Records: A Threat-Monitoring Scheme for On Line Dialogue

1976 ◽  
Vol 15 (01) ◽  
pp. 36-42 ◽  
Author(s):  
J. Schlörer
Keyword(s):  
Statistical Data ◽  
Cost Benefit ◽  
Data Bank ◽  
High Ratio ◽  
Point Of View ◽  
Data Sets ◽  
Monitoring Scheme ◽  
Access Controls ◽  
On Line ◽  
Bona Fide

From a statistical data bank containing only anonymous records, the records sometimes may be identified and then retrieved, as personal records, by on line dialogue. The risk mainly applies to statistical data sets representing populations, or samples with a high ratio n/N. On the other hand, access controls are unsatisfactory as a general means of protection for statistical data banks, which should be open to large user communities. A threat monitoring scheme is proposed, which will largely block the techniques for retrieval of complete records. If combined with additional measures (e.g., slight modifications of output), it may be expected to render, from a cost-benefit point of view, intrusion attempts by dialogue valueless, if not absolutely impossible. The bona fide user has to pay by some loss of information, but considerable flexibility in evaluation is retained. The proposal of controlled classification included in the scheme may also be useful for off line dialogue systems.

dC/dV and CV Characterization of Gate Resistance Defects in eDRAM Circuits

2013 ◽  
Author(s):  
Sweta Pendyala ◽  
Dave Albert ◽  
Katherine Hawkins ◽  
Michael Tenney
Keyword(s):  
Deep Submicron ◽  
Work Flow ◽  
Localization Technique ◽  
Characterization Techniques ◽  
Capacitance Voltage ◽  
Gate Resistance

Abstract Resistive gate defects are unusual and difficult to detect with conventional techniques [1] especially on advanced devices manufactured with deep submicron SOI technologies. An advanced localization technique such as Scanning Capacitance Imaging is essential for localizing these defects, which can be followed by DC probing, dC/dV, CV (Capacitance-Voltage) measurements to completely characterize the defect. This paper presents a case study demonstrating this work flow of characterization techniques.

Combine Micro-Probing and OBIRCH to Catch Non-Recognizable Fault in RF and Mixed-Mode Integrated Circuits

2007 ◽  
Author(s):  
Cha-Ming Shen ◽  
Yen-Long Chang ◽  
Lian-Fon Wen ◽  
Tan-Chen Chuang ◽  
Shi-Chen Lin ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Radio Frequency ◽  
Failure Analysis ◽  
Case Studies ◽  
Mixed Mode ◽  
Failure Mechanisms ◽  
Deep Submicron ◽  
Digital Logic ◽  
Successful Approach ◽  
Cmos Processes

Abstract Highly-integrated radio frequency and mixed-mode devices that are manufactured in deep-submicron or more advanced CMOS processes are becoming more complex to analyze. The increased complexity presents us with many eccentric failure mechanisms that are uniquely different from traditional failure mechanisms found during failure analysis on digital logic applications. This paper presents a novel methodology to overcome the difficulties and discusses two case studies which demonstrate the application of the methodology. Through the case studies, the methodology was proven to be a successful approach. It is also proved how this methodology would work for such non-recognizable failures.

Thermal Frequency Imaging: A New Application of Laser Voltage Imaging Applied on 40nm Technology

2011 ◽  
Author(s):  
Guillaume Celi ◽  
Sylvain Dudit ◽  
Thierry Parrassin ◽  
Philippe Perdu ◽  
Antoine Reverdy ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Laser Beam ◽  
Integrated Circuit ◽  
Carrier Density ◽  
Deep Submicron ◽  
Charge Carrier Density ◽  
Voltage Imaging ◽  
A New Technique ◽  
Scan Chain

Abstract For Very Deep submicron Technologies, techniques based on the analysis of reflected laser beam properties are widely used. The Laser Voltage Imaging (LVI) technique, introduced in 2009, allows mapping frequencies through the backside of integrated circuit. In this paper, we propose a new technique based on the LVI technique to debug a scan chain related issue. We describe the method to use LVI, usually dedicated to frequency mapping of digital active parts, in a way that enables localization of resistive leakage. Origin of this signal is investigated on a 40nm case study. This signal can be properly understood when two different effects, charge carrier density variations (LVI) and thermo reflectance effect (Thermal Frequency Imaging, TFI), are taken into account.

Reliability-Driven CAD System for Deep-Submicron VLSI Circuits

1998 ◽  
Author(s):  
S. M. Kang ◽  
E. Rosenbaum ◽  
Y. K. Cheng ◽  
L. P. Yuan ◽  
T. Li
Keyword(s):  
Deep Submicron ◽  
Vlsi Circuits ◽  
Cad System

Fuzzy control of coagulation reaction through streaming current monitoring

1997 ◽  
Vol 36 (4) ◽  
pp. 127-134 ◽  
Author(s):  
J. C. Liu ◽  
M. D. Wu
Keyword(s):  
Fuzzy Logic Controller ◽  
Treatment Plant ◽  
Control Process ◽  
Water Treatment Plant ◽  
Critical Parameters ◽  
Flow Mode ◽  
Raw Water ◽  
Streaming Current ◽  
On Line ◽  
Current Monitoring

A fuzzy logic controller (FLC) incorporating the streaming current detector (SDC) was utilized in the automatic control of the coagulation reaction. Kaolinite was used to prepare synthetic raw water, and ferric chloride was used as the coagulant. The control set point was decided at a streaming current (SC) of −0.05 and pH of 8.0 from jar tests, zeta potential and streaming current measurements. A bench-scale water treatment plant with rapid mix, flocculation, and sedimentation units, operated in a continuous-flow mode, was utilized to simulate the reaction. Two critical parameters affecting the coagulation reaction, i.e., pH and streaming current, were chosen as process outputs; while coagulant dose and base dose were chosen as control process inputs. They were on-line monitored and transduced through a FLC. With raw water of initial turbidity of 110 NTU, residual turbidity of lower than 10 NTU before filtration was obtained. Results show that this combination functions satisfactorily for coagulation control.

An IoT‐Based Smart Monitoring Scheme for Solar PV Applications

2021 ◽  
pp. 211-233
Author(s):  
Senthil Kumar Ramu ◽  
Gerald Christopher Raj Irudayaraj ◽  
Rajarajan Elango
Keyword(s):  
Solar Pv ◽  
Monitoring Scheme

scholarly journals Technology Used to Recognize Activities of Daily Living in Community-Dwelling Older Adults

2020 ◽  
Vol 18 (1) ◽  
pp. 163
Author(s):  
Nicola Camp ◽  
Martin Lewis ◽  
Kirsty Hunter ◽  
Julie Johnston ◽  
Massimiliano Zecca ◽  
...  
Keyword(s):  
Older Adults ◽  
Activities Of Daily Living ◽  
Daily Living ◽  
Wearable Technology ◽  
Community Dwelling ◽  
Use Of Technology ◽  
Key Stakeholders ◽  
Environmental Technologies ◽  
Current Monitoring ◽  
Future Work

The use of technology has been suggested as a means of allowing continued autonomous living for older adults, while reducing the burden on caregivers and aiding decision-making relating to healthcare. However, more clarity is needed relating to the Activities of Daily Living (ADL) recognised, and the types of technology included within current monitoring approaches. This review aims to identify these differences and highlight the current gaps in these systems. A scoping review was conducted in accordance with PRISMA-ScR, drawing on PubMed, Scopus, and Google Scholar. Articles and commercially available systems were selected if they focused on ADL recognition of older adults within their home environment. Thirty-nine ADL recognition systems were identified, nine of which were commercially available. One system incorporated environmental and wearable technology, two used only wearable technology, and 34 used only environmental technologies. Overall, 14 ADL were identified but there was variation in the specific ADL recognised by each system. Although the use of technology to monitor ADL of older adults is becoming more prevalent, there is a large variation in the ADL recognised, how ADL are defined, and the types of technology used within monitoring systems. Key stakeholders, such as older adults and healthcare workers, should be consulted in future work to ensure that future developments are functional and useable.

Sign in / Sign up

Export Citation Format

Share Document