An on-chip clock generation scheme for faster-than-at-speed delay testing

2010 ◽  
Author(s):  
Songwei Pei ◽  
Huawei Li ◽  
Xiaowei Li
Keyword(s):  
Delay Testing ◽  
Clock Generation ◽  
On Chip

Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression

2005 ◽  
Author(s):  
H. Nakamura ◽  
A. Shirokane ◽  
Y. Nishizaki ◽  
A. Uzzaman ◽  
V. Chickermane ◽  
...  
Keyword(s):  
Low Cost ◽  
Delay Testing ◽  
Test Compression ◽  
On Chip

An on-chip frequency programmable test clock generation and application method for small delay defect detection

Integration ◽  
2015 ◽  
Vol 49 ◽  
pp. 87-97 ◽  
Author(s):  
Songwei Pei ◽  
Huawei Li ◽  
Song Jin ◽  
Jun Liu ◽  
Xiaowei Li
Keyword(s):  
Defect Detection ◽  
Clock Generation ◽  
Application Method ◽  
Small Delay ◽  
On Chip

scholarly journals Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality

2005 ◽  
Author(s):  
M. Beck ◽  
O. Barondeau ◽  
M. Kaibel ◽  
F. Poehl ◽  
Xijiang Lin ◽  
...  
Keyword(s):  
Logic Design ◽  
Delay Test ◽  
Test Quality ◽  
Clock Generation ◽  
On Chip
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