Delta-IDDQ Testing of Resistive Short Defects

2006 15th Asian Test Symposium ◽

10.1109/ats.2006.260994 ◽

2006 ◽

Cited By ~ 2

Author(s):

Piet Engelke ◽

Ilia Polian ◽

Hans Manhaeve ◽

Michel Renovell ◽

Bernd Becker

Keyword(s):

Iddq Testing ◽

Resistive Short Defects

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IDDQ Testing in CMOS Digital ASICs

IDDQ Testing of VLSI Circuits ◽

10.1007/978-1-4615-3146-3_3 ◽

1992 ◽

pp. 31-39 ◽

Cited By ~ 11

Author(s):

Roger Perry

Keyword(s):

Iddq Testing

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I/sub DDQ/ sensing technique for high speed IDDQ testing

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990268 ◽

2002 ◽

Cited By ~ 3

Author(s):

T. Takeda ◽

M. Hashizume ◽

M. Ichimiya ◽

H. Yotsuyanagi ◽

Y. Miura ◽

...

Keyword(s):

High Speed ◽

Iddq Testing

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Divide-and-conquer IDDQ testing for core-based system chips

Proceedings of ASP-DAC/VLSI Design 2002. 7th Asia and South Pacific Design Automation Conference and 15h International Conference on VLSI Design ◽

10.1109/aspdac.2002.995025 ◽

2003 ◽

Cited By ~ 6

Author(s):

C.P. Ravikumar ◽

R. Kumar

Keyword(s):

Divide And Conquer ◽

Iddq Testing

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Temperature dependence of IDDQ distribution: application for thermal delta IDDQ testing

IET Circuits Devices & Systems ◽

10.1049/iet-cds:20070074 ◽

2007 ◽

Vol 1 (6) ◽

pp. 509

Author(s):

A. Kaltchenko ◽

O. Semenov

Keyword(s):

Temperature Dependence ◽

Iddq Testing

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A differential built-in current sensor design for high speed IDDQ testing

Proceedings of the 8th International Conference on VLSI Design ◽

10.1109/icvd.1995.512150 ◽

2002 ◽

Cited By ~ 8

Author(s):

J.P. Hurst ◽

A.D. Singh

Keyword(s):

High Speed ◽

Current Sensor ◽

Sensor Design ◽

Iddq Testing

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Eigen-signatures for regularity-based IDDQ testing

Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) ◽

10.1109/vts.2002.1011155 ◽

2003 ◽

Cited By ~ 6

Author(s):

Y. Okuda

Keyword(s):

Iddq Testing

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A differential built-in current sensor design for high-speed IDDQ testing

IEEE Journal of Solid-State Circuits ◽

10.1109/4.553192 ◽

1997 ◽

Vol 32 (1) ◽

pp. 122-125 ◽

Cited By ~ 26

Author(s):

J.P. Hurst ◽

A.D. Singh

Keyword(s):

High Speed ◽

Current Sensor ◽

Sensor Design ◽

Iddq Testing

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Observation time reduction for IDDQ testing of bridging faults in sequential circuits

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741631 ◽

2002 ◽

Cited By ~ 4

Author(s):

Y. Higami ◽

K.K. Saluja ◽

K. Kinoshita

Keyword(s):

Observation Time ◽

Sequential Circuits ◽

Bridging Faults ◽

Iddq Testing ◽

Time Reduction

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Current sensor and test processor design for integration of logic and IDDQ testing of CMOS ICs

ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187) ◽

10.1109/smelec.1998.781172 ◽

2002 ◽

Author(s):

M. Altaf-Ul-Amin ◽

Z.M. Darus

Keyword(s):

Current Sensor ◽

Processor Design ◽

Iddq Testing

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ATE features for Iddq testing

Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259) ◽

10.1109/ats.1998.741607 ◽

2002 ◽

Author(s):

M.G. Faust

Keyword(s):

Iddq Testing

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