IDDQ Testing of VLSI Circuits
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11

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Published By Springer US

9781461363774, 9781461531463

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Diagnosis of Leakage Faults with I DDQ

IDDQ Testing of VLSI Circuits ◽

10.1007/978-1-4615-3146-3_8 ◽

1992 ◽

pp. 81-89

Author(s):

Robert C. Aitken

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Reliability Benefits of I DDQ

IDDQ Testing of VLSI Circuits ◽

10.1007/978-1-4615-3146-3_4 ◽

1992 ◽

pp. 41-49 ◽

Cited By ~ 1

Author(s):

Steven D. McEuen

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IDDQ Testing in CMOS Digital ASICs

IDDQ Testing of VLSI Circuits ◽

10.1007/978-1-4615-3146-3_3 ◽

1992 ◽

pp. 31-39 ◽

Cited By ~ 11

Author(s):

Roger Perry

Keyword(s):

Iddq Testing

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QUIETEST: A Methodology for Selecting I DDQ Test Vectors

IDDQ Testing of VLSI Circuits ◽

10.1007/978-1-4615-3146-3_6 ◽

1992 ◽

pp. 63-71 ◽

Cited By ~ 2

Author(s):

Weiwei Mao ◽

Ravi K. Gulati

Keyword(s):

Test Vectors

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I DDQ Testing as a Component of a Test Suite: The Need for Several Fault Coverage Metrics

IDDQ Testing of VLSI Circuits ◽

10.1007/978-1-4615-3146-3_2 ◽

1992 ◽

pp. 19-30 ◽

Cited By ~ 1

Author(s):

Peter C. Maxwell ◽

Robert C. Aitken

Keyword(s):

Fault Coverage ◽

Test Suite ◽

Coverage Metrics

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Proportional BIC Sensor for Current Testing

IDDQ Testing of VLSI Circuits ◽

10.1007/978-1-4615-3146-3_10 ◽

1992 ◽

pp. 101-110 ◽

Cited By ~ 5

Author(s):

Josep Rius ◽

J. Figueras

Keyword(s):

Current Testing

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I DDQ Testing: A Review

IDDQ Testing of VLSI Circuits ◽

10.1007/978-1-4615-3146-3_1 ◽

1992 ◽

pp. 5-17 ◽

Cited By ~ 2

Author(s):

Jerry M. Soden ◽

Charles F. Hawkins ◽

Ravi K. Gulati ◽

Weiwei Mao

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Generation and Evaluation of Current and Logic Tests for Switch-Level Sequential Circuits

IDDQ Testing of VLSI Circuits ◽

10.1007/978-1-4615-3146-3_7 ◽

1992 ◽

pp. 73-80 ◽

Cited By ~ 1

Author(s):

Chun-Hung Chen ◽

Jacob A. Abraham

Keyword(s):

Sequential Circuits

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Quiescent Current Analysis and Experimentation of Defective CMOS Circuits

IDDQ Testing of VLSI Circuits ◽

10.1007/978-1-4615-3146-3_5 ◽

1992 ◽

pp. 51-62 ◽

Cited By ~ 10

Author(s):

J. A. Segura ◽

V. H. Champac ◽

R. RodríGuez-Montañés ◽

J. Figueras ◽

J. A. Rubio

Keyword(s):

Cmos Circuits ◽

Current Analysis ◽

Quiescent Current

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Design of ICs Applying Built-in Current Testing

IDDQ Testing of VLSI Circuits ◽

10.1007/978-1-4615-3146-3_11 ◽

1992 ◽

pp. 111-120 ◽

Cited By ~ 8

Author(s):

Wojciech Maly ◽

Marek Patyra

Keyword(s):

Current Testing

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