resistive short defects
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Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies

2018 IEEE 19th Latin-American Test Symposium (LATS) ◽

10.1109/latw.2018.8349696 ◽

2018 ◽

Cited By ~ 1

Author(s):

Amit Karel ◽

Florence Azais ◽

Mariane Comte ◽

Jean-Marc Galliere ◽

Michel Renovell

Keyword(s):

Comparative Analysis ◽

Process Variations ◽

Resistive Short Defects

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Influence of Body-Biasing, Supply Voltage, and Temperature on the Detection of Resistive Short Defects in FDSOI Technology

IEEE Transactions on Nanotechnology ◽

10.1109/tnano.2017.2664895 ◽

2017 ◽

Vol 16 (3) ◽

pp. 417-430 ◽

Cited By ~ 2

Author(s):

Amit Karel ◽

Mariane Comte ◽

Jean-Marc Galliere ◽

Florence Azais ◽

Michel Renovell

Keyword(s):

Supply Voltage ◽

Body Biasing ◽

Resistive Short Defects

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An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects

2009 27th IEEE VLSI Test Symposium ◽

10.1109/vts.2009.57 ◽

2009 ◽

Author(s):

N. Houarche ◽

M. Comte ◽

M. Renovell ◽

A. Czutro ◽

P. Engelke ◽

...

Keyword(s):

Fault Simulation ◽

Delay Faults ◽

Electrical Model ◽

Small Delay ◽

Resistive Short Defects

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Delta-IDDQ Testing of Resistive Short Defects

2006 15th Asian Test Symposium ◽

10.1109/ats.2006.260994 ◽

2006 ◽

Cited By ~ 2

Author(s):

Piet Engelke ◽

Ilia Polian ◽

Hans Manhaeve ◽

Michel Renovell ◽

Bernd Becker

Keyword(s):

Iddq Testing ◽

Resistive Short Defects

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