A New, Flexible and Very Accurate Crosstalk Fault Model to Analyze the Effects of Coupling Noise between the Interconnects on Signal Integrity Losses in Deep Submicron Chips
2008 ◽
Vol E91-D
(3)
◽
pp. 667-674
◽
2010 ◽
Vol 19
(05)
◽
pp. 949-973
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