High-temperature CW operation of InGaAsP-InP semi-insulating buried heterostructure lasers using reactive ion-etching technique

1995 ◽  
Vol 7 (8) ◽  
pp. 828-829 ◽  
Author(s):  
T. Higashi ◽  
T. Takeuchi ◽  
K. Morito ◽  
M. Matsuda ◽  
H. Soda
Author(s):  
R Suryana ◽  
N D Pratiwi ◽  
M Handayani ◽  
M Santika ◽  
O Nakatsuka

Author(s):  
Katsuyoshi Suzuki ◽  
Shigeki Takahashi ◽  
Makoto Okano ◽  
Masahiro Imada ◽  
Kenji Ishizaki ◽  
...  

2015 ◽  
Vol 1109 ◽  
pp. 64-68
Author(s):  
Q. Humayun ◽  
U. Hashim

The important role of reactive ion etching (RIE) technique is to etch the semiconductor surface directionally. The purpose of the current research is to fabricate polysilicon micro-gap structures by RIE technique for future biosensing application. Therefore zero-gap microstructure of butterfly topology was designed by using AutoCAD software and finally the designed was transferred to commercial chrome glass photomask. Ploysilicon wafer samples were selected to achieve high conductivity during electrical characterization measurement. The fabrication process starts from samples resist coating and then by employing photolithography through chrome glass photomask the zero-gap pattern of butterfly topology was transferred to resist coated sample wafer followed by resist stripping from exposed area and finally by reactive ion etching (RIE) technique the open area of polysilicon was etched directionally at different etching time to fabricate micro-gap structure on wafer samples. The spacing of fabricated micro-gap structures will be further shrink by thermal oxidation (size reduction technique) until to nanosize gap spacing. The proposed nanospacing gap will definitely show the capability to detect the bio molecule when inserted into the gap spacing.


1990 ◽  
Vol 201 ◽  
Author(s):  
B. J. Howard ◽  
S. K. Wolterman ◽  
W. J. Yoo ◽  
B. Gittleman ◽  
CH. SteinbrÜchel

AbstractCopper may become an alternative to aluminum as an interconnect material in future multilevel metallization schemes if it is possible to pattern Cu by dry etching in a manufacturable process. Here we report results on the reactive ion etching of Cu in SiCl4 /Ar, SiCl4/N2, and CCl2F2/Ar plasmas. Etch rates have been investigated as a function of various plasma parameters, such as gas composition, pressure, etc., and substrate temperature. We have obtained etch rates as high as 850 Å /min with SiCl4/N2 and a substrate temperature of ∼ 200 ° C. Also, it appears feasible to pattern Cu anisotropically using either polyimide or amorphous carbon as a high-temperature etch mask.


AIP Advances ◽  
2016 ◽  
Vol 6 (8) ◽  
pp. 085111 ◽  
Author(s):  
Chia-Pin Yeh ◽  
Marco Lisker ◽  
Bodo Kalkofen ◽  
Edmund P. Burte

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