Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFETs
2011 ◽
Vol 58
(3)
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pp. 812-818
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2012 ◽
Vol 33
(11)
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pp. 1538-1540
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Keyword(s):
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2004 ◽
Vol 48
(6)
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pp. 985-997
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1996 ◽
Vol 51-52
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pp. 585-596
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2007 ◽
Vol 47
(4-5)
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pp. 577-580
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2005 ◽
Vol 26
(10)
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pp. 764-766
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2002 ◽
Vol 49
(12)
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pp. 2373-2373
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1993 ◽
Vol 22
(1-4)
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pp. 285-288
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