Low Frequency Noise Degradation in 45 nm High-k nMOSFETs due to Hot Carrier and Constant Voltage Stress

2009 ◽  
Author(s):  
M. Shahriar Rahman ◽  
Zeynep Çelik-Butler ◽  
M. A. Quevedo-Lopez ◽  
Ajit Shanware ◽  
Luigi Colombo ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Constant Voltage ◽  
Low Frequency Noise ◽  
Hot Carrier ◽  
High K ◽  
Voltage Stress

Hot-Carrier- and Constant-Voltage-Stress-Induced Low-Frequency Noise in Nitrided High- $k$ Dielectric MOSFETs

2009 ◽  
Vol 9 (2) ◽  
pp. 203-208 ◽  
Author(s):  
M.S. Rahman ◽  
T.H. Morshed ◽  
Z. Celik-Butler ◽  
M.A. Quevedo-Lopez ◽  
A. Shanware ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Constant Voltage ◽  
Low Frequency Noise ◽  
Hot Carrier ◽  
High K ◽  
Voltage Stress ◽  
High K Dielectric

Investigation of low-frequency noise of 28-nm technology process of high-k/metal gate p-MOSFETs with fluorine incorporation

2016 ◽  
Vol 115 ◽  
pp. 7-11
Author(s):  
Tsung-Hsien Kao ◽  
Shoou-Jinn Chang ◽  
Yean-Kuen Fang ◽  
Po-Chin Huang ◽  
Bo-Chin Wang ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
High K ◽  
Technology Process ◽  
28 Nm

Effect of $\hbox{NH}_{3}$ Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-$ \kappa$ Dielectric nMOSFETs

2011 ◽  
Vol 58 (3) ◽  
pp. 812-818 ◽  
Author(s):  
Yu-Ting Chen ◽  
Kun-Ming Chen ◽  
Cheng-Li Lin ◽  
Wen-Kuan Yeh ◽  
Guo-Wei Huang ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Hot Carrier ◽  
Plasma Nitridation

Improving Low-Frequency Noise in 14-nm FinFET by Optimized High-k/Metal Gate Thermal Processing

2021 ◽  
pp. 1-1
Author(s):  
Hao Zhu ◽  
Bin Ye ◽  
Chengkang Tang ◽  
Xianghui Li ◽  
Qingqing Sun ◽  
...  
Keyword(s):  
Thermal Processing ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
High K

scholarly journals Low-Frequency Noise Assessment of Work Function Engineering Cap Layers in High-k Gate Stacks

2019 ◽  
Vol 8 (2) ◽  
pp. N25-N31 ◽  
Author(s):  
C. Claeys ◽  
R. Ritzenthaler ◽  
T. Schram ◽  
H. Arimura ◽  
N. Horiguchi ◽  
...  
Keyword(s):  
Work Function ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gate Stacks ◽  
High K ◽  
Noise Assessment

Low-Frequency Noise Investigation and Noise Variability Analysis in High- $k$/Metal Gate 32-nm CMOS Transistors

2011 ◽  
Vol 58 (8) ◽  
pp. 2310-2316 ◽  
Author(s):  
Diana Lopez ◽  
S. Haendler ◽  
C. Leyris ◽  
Gregory Bidal ◽  
Gérard Ghibaudo
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Variability Analysis ◽  
Cmos Transistors ◽  
High K

Impact of Trap Behavior in High-k/Metal Gate p-MOSFET with Incorporated Fluorine on Low-Frequency Noise Characteristics

2014 ◽  
Author(s):  
T.–H. Kao ◽  
S.–L. Wu ◽  
C.–Y. Wu ◽  
Y.–K. Fang ◽  
P.–C. Huang ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Noise Characteristics ◽  
High K

Investigation of Low-Frequency Noise Behavior After Hot-Carrier Stress in an n-Channel Junctionless Nanowire MOSFET

2012 ◽  
Vol 33 (11) ◽  
pp. 1538-1540 ◽  
Author(s):  
Chan-Hoon Park ◽  
Myung-Dong Ko ◽  
Ki-Hyun Kim ◽  
Sang-Hyun Lee ◽  
Jun-Sik Yoon ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Nanowire Mosfet

scholarly journals Low-frequency noise in high-k LaLuO3/TiN MOSFETs

2012 ◽  
Vol 78 ◽  
pp. 51-55 ◽  
Author(s):  
Maryam Olyaei ◽  
B. Gunnar Malm ◽  
Per-Erik Hellström ◽  
Mikael Östling
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
High K
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