A high-current-gain low-temperature pseudo-HBT utilizing a sidewall base-contact structure (SICOS)

1989 ◽  
Vol 10 (10) ◽  
pp. 452-454 ◽  
Author(s):  
K. Yano ◽  
K. Nakazato ◽  
M. Miyamoto ◽  
M. Aoki ◽  
K. Shimohigashi
2013 ◽  
Vol 740-742 ◽  
pp. 974-977 ◽  
Author(s):  
Arash Salemi ◽  
Hossein Elahipanah ◽  
Benedetto Buono ◽  
Carl Mikael Zetterling ◽  
Mikael Östling

Non ion-implantation mesa etched 4H-SiC BJT with three-zone JTE of optimized lengths and doses (descending sequences) has been simulated. This design presents an efficient electric field distribution along the device. The device area has been optimized and considerably reduced. As a result of this comprehensive optimization, a high breakdown voltage and high current gain have been achieved; meanwhile the device area with a constant emitter and base contact area has been reduced by about 30%.


2008 ◽  
Vol 600-603 ◽  
pp. 1163-1166 ◽  
Author(s):  
Chih Fang Huang ◽  
Chien Yuen Tseng

This paper presents a simulation study on the thermal effects in 4H-SiC NPN BJTs. Simulation results show several important effects on the BJT characteristics such as base contact locations, current gain reduction due to high level injection in the base at high current densities, and the non-uniform current distribution due to long fingers and poor contact resistance. A DC spice model with temperature effects is created. The IVs of the model are in good agreement with measurement.


Sensors ◽  
2016 ◽  
Vol 16 (1) ◽  
pp. 74 ◽  
Author(s):  
Sang-Won Lee ◽  
Seung-Hwan Cha ◽  
Kyung-Jae Choi ◽  
Byoung-Ho Kang ◽  
Jae-Sung Lee ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document