Hot carrier degradation of n-channel MOSFETs characterized by a gated-diode measurement technique

1989 ◽  
Vol 10 (2) ◽  
pp. 76-78 ◽  
Author(s):  
T. Giebel ◽  
K. Goser
Keyword(s):  
Measurement Technique ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Modelling hot-carrier degradation of LDD NMOSFETs by using a high-resolution measurement technique

1999 ◽  
Vol 39 (6-7) ◽  
pp. 785-790 ◽  
Author(s):  
R. Dreesen ◽  
K. Croes ◽  
J. Manca ◽  
W. De Ceuninck ◽  
L. De Schepper ◽  
...  
Keyword(s):  
High Resolution ◽  
Measurement Technique ◽  
Hot Carrier ◽  
High Resolution Measurement ◽  
Resolution Measurement ◽  
Hot Carrier Degradation

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-787-C4-790
Author(s):  
P. T.J. BIERMANS ◽  
T. POORTER ◽  
H. J.H. MERKS-EPPINGBROEK
Keyword(s):  
Hot Carrier ◽  
The Impact ◽  
Hot Carrier Degradation

Localizing Hot-Carrier Degradation in Silicon Trench MOSFETs

2021 ◽  
Vol 68 (4) ◽  
pp. 1804-1809
Author(s):  
Bernhard Ruch ◽  
Gregor Pobegen ◽  
Tibor Grasser
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Degradation
Sign in / Sign up

Export Citation Format

Share Document