Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits
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A study of the influence of inter-metal dielectrics on electromigration performance

Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.1995.487615 ◽

2002 ◽

Author(s):

S. Foley ◽

A. Ryan ◽

D. Martin ◽

A. Mathewson

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Power-on contention: a reliability issue for logic devices

Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.1995.487589 ◽

2002 ◽

Cited By ~ 1

Author(s):

R. Muniandy ◽

S. Miller ◽

Lim Yew Tee ◽

R. Boylan

Keyword(s):

Logic Devices ◽

Reliability Issue

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A new spectroscopic photon emission microscope system for semiconductor device analysis

Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.1995.487596 ◽

2002 ◽

Cited By ~ 6

Author(s):

Y.Y. Liu ◽

J.M. Tao ◽

D.S.H. Chan ◽

J.C.H. Phang ◽

W.K. Chim

Keyword(s):

Semiconductor Device ◽

Photon Emission

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Oxidation of copper leadframe

Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.1995.487626 ◽

2002 ◽

Cited By ~ 6

Author(s):

G.L. Ang ◽

L.C. Goh ◽

K.W. Heng ◽

S.K. Lahiri

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A new interlayer dielectric (ILD) cracking mechanism in ceramic packaged multilayered CMOS devices

Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.1995.487610 ◽

2002 ◽

Author(s):

Yeoh Eng Hong ◽

Chong Aik Kean ◽

R. Tay

Keyword(s):

Interlayer Dielectric ◽

Cracking Mechanism

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Guard ring diodes for suppression of substrate noise and improved reliability in mixed-mode CMOS circuits

Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.1995.487613 ◽

2002 ◽

Cited By ~ 3

Author(s):

L. Forbes ◽

W.T. Lim ◽

K.T. Yan

Keyword(s):

Mixed Mode ◽

Guard Ring ◽

Cmos Circuits ◽

Substrate Noise

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Poly-3 bitline crack [DRAMs]

Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.1995.487624 ◽

2002 ◽

Cited By ~ 1

Author(s):

W. Tan ◽

Lee Keat Peng ◽

Giam Siang Tian

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Reliability assessment of EPROM memory retention for wafer level sort programming

Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.1995.487625 ◽

2002 ◽

Author(s):

Teong-San Yeoh ◽

Shze-Jer Hu

Keyword(s):

Reliability Assessment ◽

Memory Retention ◽

Wafer Level

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Focused ion beam sample preparation for high spatial resolution X-ray microanalysis

Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.1995.487593 ◽

2002 ◽

Author(s):

K.L. Pey ◽

A.J. Leslie

Keyword(s):

Sample Preparation ◽

Spatial Resolution ◽

Focused Ion Beam ◽

High Spatial Resolution ◽

Ion Beam ◽

X Ray ◽

Beam Sample

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Surface analysis and application in magnetic hard disk media

Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits ◽

10.1109/ipfa.1995.487621 ◽

2002 ◽

Author(s):

R. Gopalakrishnan

Keyword(s):

Surface Analysis ◽

Hard Disk ◽

Magnetic Hard Disk

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Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated CircuitsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A study of the influence of inter-metal dielectrics on electromigration performance

Power-on contention: a reliability issue for logic devices

A new spectroscopic photon emission microscope system for semiconductor device analysis

Oxidation of copper leadframe

A new interlayer dielectric (ILD) cracking mechanism in ceramic packaged multilayered CMOS devices

Guard ring diodes for suppression of substrate noise and improved reliability in mixed-mode CMOS circuits

Poly-3 bitline crack [DRAMs]

Reliability assessment of EPROM memory retention for wafer level sort programming

Focused ion beam sample preparation for high spatial resolution X-ray microanalysis

Surface analysis and application in magnetic hard disk media

Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits
Latest Publications