Positive oxide-charge generation during 0.25 /spl mu/m PMOSFET hot-carrier degradation

1994 ◽  
Vol 15 (10) ◽  
pp. 427-429 ◽  
Author(s):  
R. Woltjer ◽  
G.M. Paulzen ◽  
H. Lifka ◽  
P. Woerlee
Keyword(s):  
Charge Generation ◽  
Oxide Charge ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Hot-carrier degradation and oxide charge build-up in self-aligned etched-polysilicon npn bipolar transistors

1997 ◽  
Vol 44 (11) ◽  
pp. 2059-2063 ◽  
Author(s):  
A. Neviani ◽  
P. Pavan ◽  
A. Nardi ◽  
A. Chantre ◽  
L. Vendrame ◽  
...  
Keyword(s):  
Bipolar Transistors ◽  
Oxide Charge ◽  
Hot Carrier ◽  
Hot Carrier Degradation

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-787-C4-790
Author(s):  
P. T.J. BIERMANS ◽  
T. POORTER ◽  
H. J.H. MERKS-EPPINGBROEK
Keyword(s):  
Hot Carrier ◽  
The Impact ◽  
Hot Carrier Degradation

Localizing Hot-Carrier Degradation in Silicon Trench MOSFETs

2021 ◽  
Vol 68 (4) ◽  
pp. 1804-1809
Author(s):  
Bernhard Ruch ◽  
Gregor Pobegen ◽  
Tibor Grasser
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Degradation
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