Channel-length-independent hot-carrier degradation in analog p-MOS operation

1992 ◽  
Vol 13 (11) ◽  
pp. 590-592 ◽  
Author(s):  
R. Thewes ◽  
M. Broz ◽  
G. Tempel ◽  
W. Weber ◽  
K. Goser
Keyword(s):  
Channel Length ◽  
Hot Carrier ◽  
Hot Carrier Degradation

On the channel-length dependence of the hot-carrier degradation of n-channel MOSFETs

1989 ◽  
Vol 10 (12) ◽  
pp. 553-555 ◽  
Author(s):  
R. Bellens ◽  
P. Heremans ◽  
G. Groeseneken ◽  
H.E. Maes
Keyword(s):  
Channel Length ◽  
Hot Carrier ◽  
Length Dependence ◽  
Hot Carrier Degradation

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

THE IMPACT OF DIFFERENT HOT-CARRIER-DEGRADATION COMPONENTS ON THE OPTIMIZATION OF SUBMICRON n-CHANNEL LDD TRANSISTORS

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-787-C4-790
Author(s):  
P. T.J. BIERMANS ◽  
T. POORTER ◽  
H. J.H. MERKS-EPPINGBROEK
Keyword(s):  
Hot Carrier ◽  
The Impact ◽  
Hot Carrier Degradation
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