On the fault coverage of gate delay fault detecting tests

A.K. Pramanick; S.M. Reddy

doi:10.1109/43.559333

On the fault coverage of gate delay fault detecting tests

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.559333 ◽

1997 ◽

Vol 16 (1) ◽

pp. 78-94 ◽

Cited By ~ 27

Author(s):

A.K. Pramanick ◽

S.M. Reddy

Keyword(s):

Fault Coverage ◽

Gate Delay ◽

Delay Fault ◽

Gate Delay Fault

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Gate-delay-fault testability properties of multiplexor-based networks

Formal Methods in System Design ◽

10.1007/bf01383945 ◽

1993 ◽

Vol 2 (1) ◽

pp. 93-112 ◽

Cited By ~ 1

Author(s):

Pranav Ashar ◽

Srinivas Devadas ◽

Kurt Keutzer

Keyword(s):

Gate Delay ◽

Delay Fault ◽

Gate Delay Fault

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Test generation for multiple-threshold gate-delay fault model

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990290 ◽

2002 ◽

Cited By ~ 7

Author(s):

M. Nakao ◽

Y. Kiyoshige ◽

K. Hatayama ◽

Y. Sato ◽

T. Nagumo

Keyword(s):

Test Generation ◽

Fault Model ◽

Gate Delay ◽

Delay Fault ◽

Multiple Threshold ◽

Gate Delay Fault ◽

Threshold Gate

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DFSIM: a gate-delay fault simulator for sequential circuits

Proceedings ED&TC European Design and Test Conference ◽

10.1109/edtc.1996.494160 ◽

2002 ◽

Cited By ~ 1

Author(s):

P. Cavallera ◽

P. Girard ◽

C. Landrault ◽

S. Pravossoudovitch

Keyword(s):

Sequential Circuits ◽

Gate Delay ◽

Delay Fault ◽

Gate Delay Fault

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Gate-delay fault test with conventional scan-design

Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC ◽

10.1109/edtc.1994.326825 ◽

2002 ◽

Cited By ~ 1

Author(s):

A. Kunzmann ◽

F. Bohland

Keyword(s):

Gate Delay ◽

Scan Design ◽

Delay Fault ◽

Gate Delay Fault

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Multiple tests for each gate delay fault: higher coverage and lower test application cost

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1584089 ◽

2006 ◽

Cited By ~ 10

Author(s):

S. Irajpour ◽

S.K. Gupta ◽

M.A. Breuer

Keyword(s):

Gate Delay ◽

Delay Fault ◽

Multiple Tests ◽

Test Application ◽

Lower Test ◽

Gate Delay Fault

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Gate delay fault test generation for non-scan circuits

Proceedings the European Design and Test Conference. ED&TC 1995 ◽

10.1109/edtc.1995.470379 ◽

2002 ◽

Cited By ~ 2

Author(s):

G. van Brakel ◽

U. Glaser ◽

H.G. Kerkhoff ◽

H.T. Vierhaus

Keyword(s):

Test Generation ◽

Gate Delay ◽

Delay Fault ◽

Scan Circuits ◽

Gate Delay Fault

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Gate-delay fault diagnosis using the inject-and-evaluate paradigm

17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. ◽

10.1109/dftvs.2002.1173508 ◽

2003 ◽

Cited By ~ 2

Author(s):

Horng-Bin Wang ◽

Shi-Yu Huang ◽

Jing-Reng Huang

Keyword(s):

Fault Diagnosis ◽

Gate Delay ◽

Delay Fault ◽

Gate Delay Fault

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Gate-Delay-Fault Testability Properties of Multiplexor-Based Networks

1991, Proceedings. International Test Conference ◽

10.1109/test.1991.519755 ◽

2005 ◽

Cited By ~ 10

Author(s):

P. Ashar ◽

S. Devadas ◽

K. Keutzer

Keyword(s):

Gate Delay ◽

Delay Fault ◽

Gate Delay Fault

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Identification of single gate delay fault redundancies

Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computers & Processors ◽

10.1109/iccd.1992.276213 ◽

2003 ◽

Author(s):

D. Brand ◽

V.S. Iyengar

Keyword(s):

Gate Delay ◽

Delay Fault ◽

Gate Delay Fault

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Flip–flop selection for partial enhance scan chain using DTESFF for high transition delay fault coverage

International Journal of Systems Assurance Engineering and Management ◽

10.1007/s13198-013-0170-9 ◽

2013 ◽

Vol 4 (3) ◽

pp. 303-311 ◽

Cited By ~ 2

Author(s):

Ashok Kumar Suhag ◽

Vivek Shrivastava ◽

Nidhi Singh

Keyword(s):

Fault Coverage ◽

Delay Fault ◽

Flip Flop ◽

High Transition ◽

Selection For ◽

Transition Delay ◽

Scan Chain

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