Transition fault testing for sequential circuits

1993 ◽  
Vol 12 (12) ◽  
pp. 1971-1983 ◽  
Author(s):  
Kwang-Ting Cheng
Keyword(s):  
Sequential Circuits ◽  
Fault Testing ◽  
Transition Fault

scholarly journals Black box delay fault models for non-scan sequential circuits

2018 ◽  
Vol 15 (1) ◽  
pp. 237-256
Author(s):  
Eduardas Bareisa ◽  
Vacius Jusas ◽  
Kestutis Motiejunas ◽  
Liudas Motiejunas ◽  
Rimantas Seinauskas
Keyword(s):  
Fault Model ◽  
Black Box ◽  
Sequential Circuits ◽  
Fault Models ◽  
Delay Fault ◽  
Second Stage ◽  
Transition Faults ◽  
Transition Fault ◽  
Functional Delay ◽  
Two Stages

We presented nine new black box delay fault models for non-scan sequential circuits at the functional level, when the primary inputs and primary outputs are available only. We examined the suggested fault models in two stages. During the first stage of the experiment, we selected the best two fault models for further examination on the base of criterion proposed in the paper. During the second stage, we used the functional delay fault model and two black box delay fault models from the first stage for test selection. The comparison of fault coverages was carried out for transition faults. The obtained results demonstrate that transition fault coverages of tests selected based on proposed black box fault models are similar to coverages of tests selected based on functional delay fault model that uses the inner state of circuit.

At-Speed Transition Fault Testing With Low Speed Scan Enable

2005 ◽  
Author(s):  
N. Ahmed ◽  
C.P. Ravikumar ◽  
M. Tehranipoor ◽  
J. Plusquellic
Keyword(s):  
Fault Testing ◽  
Low Speed ◽  
Transition Fault

Deterministic Logic BIST for Transition Fault Testing

2006 ◽  
Author(s):  
V. Gherman ◽  
H.-J. Wunderlich ◽  
J. Schloeffel ◽  
M. Garbers
Keyword(s):  
Fault Testing ◽  
Transition Fault ◽  
Logic Bist

Local at-speed scan enable generation for transition fault testing using low-cost testers

2007 ◽  
Vol 26 (5) ◽  
pp. 896-906 ◽  
Author(s):  
Nisar Ahmed ◽  
Mohammad Tehranipoor ◽  
C. P. Ravikumar ◽  
Kenneth M. Butler
Keyword(s):  
Low Cost ◽  
Fault Testing ◽  
Transition Fault
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