At-Speed Transition Fault Testing With Low Speed Scan Enable

23rd IEEE VLSI Test Symposium (VTS'05) ◽

10.1109/vts.2005.31 ◽

2005 ◽

Cited By ~ 38

Author(s):

N. Ahmed ◽

C.P. Ravikumar ◽

M. Tehranipoor ◽

J. Plusquellic

Keyword(s):

Fault Testing ◽

Low Speed ◽

Transition Fault

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Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2013.2280170 ◽

2014 ◽

Vol 22 (9) ◽

pp. 1968-1979 ◽

Cited By ~ 6

Author(s):

Dong Xiang ◽

Wenjie Sui ◽

Boxue Yin ◽

Kwang-Ting Cheng

Keyword(s):

Test Generation ◽

Fault Testing ◽

Transition Fault ◽

Compact Test

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Transition fault testing for sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.251160 ◽

1993 ◽

Vol 12 (12) ◽

pp. 1971-1983 ◽

Cited By ~ 74

Author(s):

Kwang-Ting Cheng

Keyword(s):

Sequential Circuits ◽

Fault Testing ◽

Transition Fault

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Slack-based approach for peak power reduction during transition fault testing

2010 11th International Symposium on Quality Electronic Design (ISQED) ◽

10.1109/isqed.2010.5450516 ◽

2010 ◽

Cited By ~ 3

Author(s):

Manu Baby ◽

Vijay Sarathi

Keyword(s):

Peak Power ◽

Power Reduction ◽

Fault Testing ◽

Transition Fault ◽

Peak Power Reduction

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Deterministic Logic BIST for Transition Fault Testing

Eleventh IEEE European Test Symposium (ETS'06) ◽

10.1109/ets.2006.12 ◽

2006 ◽

Cited By ~ 11

Author(s):

V. Gherman ◽

H.-J. Wunderlich ◽

J. Schloeffel ◽

M. Garbers

Keyword(s):

Fault Testing ◽

Transition Fault ◽

Logic Bist

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Enhanced launch-off-capture transition fault testing

IEEE International Conference on Test, 2005. ◽

10.1109/test.2005.1583982 ◽

2006 ◽

Cited By ~ 20

Author(s):

N. Ahmed ◽

M. Tehranipoor ◽

C.P. Ravikumar

Keyword(s):

Fault Testing ◽

Transition Fault

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Local at-speed scan enable generation for transition fault testing using low-cost testers

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2007.8361583 ◽

2007 ◽

Vol 26 (5) ◽

pp. 896-906 ◽

Cited By ~ 1

Author(s):

Nisar Ahmed ◽

Mohammad Tehranipoor ◽

C. P. Ravikumar ◽

Kenneth M. Butler

Keyword(s):

Low Cost ◽

Fault Testing ◽

Transition Fault

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Stuck-open and transition fault testing in CMOS complex gates

International Test Conference 1988 Proceeding@m_New Frontiers in Testing ◽

10.1109/test.1988.207853 ◽

2003 ◽

Cited By ~ 45

Author(s):

H. Cox ◽

J. Rajski

Keyword(s):

Fault Testing ◽

Transition Fault

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Industrial evaluation of transition fault testing for cost effective offline adaptive voltage scaling

2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) ◽

10.23919/date.2018.8342022 ◽

2018 ◽

Author(s):

Mahroo Zandrahimi ◽

Philippe Debaud ◽

Armand Castillejo ◽

Zaid Al-Ars

Keyword(s):

Cost Effective ◽

Voltage Scaling ◽

Fault Testing ◽

Transition Fault

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Deterministic logic BIST for transition fault testing

IET Computers & Digital Techniques ◽

10.1049/iet-cdt:20060131 ◽

2007 ◽

Vol 1 (3) ◽

pp. 180 ◽

Cited By ~ 1

Author(s):

V. Gherman ◽

H.-J. Wunderlich ◽

J. Schloeffel ◽

M. Garbers

Keyword(s):

Fault Testing ◽

Transition Fault ◽

Logic Bist

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Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2006.884405 ◽

2007 ◽

Vol 26 (5) ◽

pp. 896-906 ◽

Cited By ~ 27

Author(s):

Nisar Ahmed ◽

Mohammad Tehranipoor ◽

C. P. Ravikumar ◽

Kenneth M. Butler

Keyword(s):

Low Cost ◽

Fault Testing ◽

Transition Fault

Download Full-text