Carrier lifetime measurement in semiconductor lasers using injection current pulses of Gaussian shape

1992 ◽  
Vol 28 (12) ◽  
pp. 2669-2673 ◽  
Author(s):  
A.M. Kusters ◽  
M. Glade ◽  
K. Heime
Keyword(s):  
Semiconductor Lasers ◽  
Carrier Lifetime ◽  
Lifetime Measurement ◽  
Injection Current ◽  
Gaussian Shape ◽  
Current Pulses

Carrier lifetime measurement by ramp recovery of p-i-n diodes

1990 ◽  
Vol 37 (8) ◽  
pp. 1921-1924 ◽  
Author(s):  
S.H. Gamal ◽  
H. Morel ◽  
J.P. Chante
Keyword(s):  
Carrier Lifetime ◽  
Lifetime Measurement

scholarly journals Minority Carrier Lifetime Measurement in Nanowire Based Solar Cells by a Reverse Recovery Transient Method

2014 ◽  
Vol 60 ◽  
pp. 181-190
Author(s):  
M. Daanoune ◽  
D. Kohen ◽  
A. Kaminski-Cachopo ◽  
C. Morin ◽  
P. Faucherand ◽  
...  
Keyword(s):  
Solar Cells ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Lifetime Measurement ◽  
Transient Method

Bulk carrier lifetime measurement by the microwave reflectance photoconductivity decay method with external surface electric field

2002 ◽  
Vol 80 (23) ◽  
pp. 4390-4392 ◽  
Author(s):  
Masaya Ichimura ◽  
Atsushi Tada ◽  
Eisuke Arai ◽  
Hiroyuki Takamatsu ◽  
Shingo Sumie
Keyword(s):  
Electric Field ◽  
Carrier Lifetime ◽  
External Surface ◽  
Lifetime Measurement ◽  
Bulk Carrier ◽  
Photoconductivity Decay ◽  
Surface Electric Field
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