Carrier lifetime measurement by ramp recovery of p-i-n diodes

1990 ◽  
Vol 37 (8) ◽  
pp. 1921-1924 ◽  
Author(s):  
S.H. Gamal ◽  
H. Morel ◽  
J.P. Chante
Keyword(s):  
Carrier Lifetime ◽  
Lifetime Measurement

scholarly journals Minority Carrier Lifetime Measurement in Nanowire Based Solar Cells by a Reverse Recovery Transient Method

2014 ◽  
Vol 60 ◽  
pp. 181-190
Author(s):  
M. Daanoune ◽  
D. Kohen ◽  
A. Kaminski-Cachopo ◽  
C. Morin ◽  
P. Faucherand ◽  
...  
Keyword(s):  
Solar Cells ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Lifetime Measurement ◽  
Transient Method

Bulk carrier lifetime measurement by the microwave reflectance photoconductivity decay method with external surface electric field

2002 ◽  
Vol 80 (23) ◽  
pp. 4390-4392 ◽  
Author(s):  
Masaya Ichimura ◽  
Atsushi Tada ◽  
Eisuke Arai ◽  
Hiroyuki Takamatsu ◽  
Shingo Sumie
Keyword(s):  
Electric Field ◽  
Carrier Lifetime ◽  
External Surface ◽  
Lifetime Measurement ◽  
Bulk Carrier ◽  
Photoconductivity Decay ◽  
Surface Electric Field

Minority Carrier Lifetime Measurement in HF Solution to Evaluate Si Substrates for Solar Cells

1990 ◽  
Vol 29 (Part 2, No. 1) ◽  
pp. L166-L168 ◽  
Author(s):  
Takayuki Nammori ◽  
Koji Okamoto ◽  
Tohru Nunoi ◽  
Yutaka Hayashi
Keyword(s):  
Solar Cells ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Lifetime Measurement ◽  
Si Substrates
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