Ionizing radiation induced leakage current on ultra-thin gate oxides
1997 ◽
Vol 44
(6)
◽
pp. 1818-1825
◽
1999 ◽
Vol 46
(6)
◽
pp. 1553-1561
◽
1998 ◽
Vol 45
(6)
◽
pp. 2375-2382
◽
1999 ◽
Vol 39
(2)
◽
pp. 221-226
◽
1983 ◽
Vol 41
◽
pp. 368-369
2019 ◽
Vol 12
(3)
◽
pp. 247-255
◽