Radiation induced leakage current and stress induced leakage current in ultra-thin gate oxides

1998 ◽  
Vol 45 (6) ◽  
pp. 2375-2382 ◽  
Author(s):  
M. Ceschia ◽  
A. Paccagnella ◽  
A. Cester ◽  
A. Scarpa ◽  
G. Ghidini
Keyword(s):  
Leakage Current ◽  
Gate Oxides ◽  
Radiation Induced ◽  
Stress Induced Leakage Current

Stress induced leakage current in ultra-thin gate oxides after constant current stress

1997 ◽  
Vol 36 (1-4) ◽  
pp. 145-148 ◽  
Author(s):  
A. Scarpa ◽  
G. Ghibaudo ◽  
G. Ghidini ◽  
G. Pananakakis ◽  
A. Paccagnella
Keyword(s):  
Leakage Current ◽  
Constant Current ◽  
Gate Oxides ◽  
Current Stress ◽  
Stress Induced Leakage Current

A model of the stress induced leakage current in gate oxides

2001 ◽  
Vol 48 (2) ◽  
pp. 285-288 ◽  
Author(s):  
L. Larcher ◽  
A. Paccagnella ◽  
G. Ghidini
Keyword(s):  
Leakage Current ◽  
Gate Oxides ◽  
Stress Induced Leakage Current

A model of radiation induced leakage current (RILC) in ultra-thin gate oxides

1999 ◽  
Vol 46 (6) ◽  
pp. 1553-1561 ◽  
Author(s):  
L. Larcher ◽  
A. Paccagnella ◽  
M. Ceschia ◽  
G. Ghidini
Keyword(s):  
Leakage Current ◽  
Gate Oxides ◽  
Radiation Induced

Total dose dependence of radiation-induced leakage current in ultra-thin gate oxides

1999 ◽  
Vol 39 (2) ◽  
pp. 221-226 ◽  
Author(s):  
M. Ceschia ◽  
A. Paccagnella ◽  
A. Scarpa ◽  
A. Cester ◽  
G. Ghidini
Keyword(s):  
Total Dose ◽  
Leakage Current ◽  
Dose Dependence ◽  
Gate Oxides ◽  
Radiation Induced
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