Effect of microstructure on media noise of CoCrTa thin film media fabricated under ultra clean sputtering process

1995 ◽  
Vol 31 (6) ◽  
pp. 2833-2835 ◽  
Author(s):  
J. Nakai ◽  
A. Kikuchi ◽  
M. Kuwabara ◽  
T. Sakurai ◽  
T. Shimatsu ◽  
...  
Keyword(s):  
Thin Film ◽  
Media Noise ◽  
Effect Of Microstructure

Effect of Microstructure on the Electromigration Life of Thin Film Al–Cu Conductors

1972 ◽  
Vol 9 (1) ◽  
pp. 283-283 ◽  
Author(s):  
B. N. Agarwala ◽  
B. Patnaik ◽  
R. Schnitzel
Keyword(s):  
Thin Film ◽  
Effect Of Microstructure

ChemInform Abstract: The Effect of Microstructure on the Magnetic Properties of Thin Film Magnetic Media

ChemInform ◽  
2010 ◽  
Vol 26 (17) ◽  
pp. no-no
Author(s):  
T. YAMASHITA ◽  
R. RANJAN ◽  
L. H. CHAN ◽  
M. LU ◽  
C. A. ROSS ◽  
...  
Keyword(s):  
Thin Film ◽  
Magnetic Properties ◽  
Magnetic Media ◽  
Effect Of Microstructure

The effect of microstructure on the hydrogenation of Mg/Fe thin film multilayers

2014 ◽  
Vol 39 (30) ◽  
pp. 17092-17103 ◽  
Author(s):  
Lennard Mooij ◽  
Tyché Perkisas ◽  
Gunnar Pálsson ◽  
Herman Schreuders ◽  
Max Wolff ◽  
...  
Keyword(s):  
Thin Film ◽  
Effect Of Microstructure

Effect of Microstructure on the Electromigration Life of Thin‐Film A1–Cu Conductors

1972 ◽  
Vol 43 (4) ◽  
pp. 1487-1493 ◽  
Author(s):  
B. N. Agarwala ◽  
B. Patnaik ◽  
R. Schnitzel
Keyword(s):  
Thin Film ◽  
Effect Of Microstructure

A study on thin-film-media noise by magnetic domain observation

1988 ◽  
Vol 24 (6) ◽  
pp. 2715-2717 ◽  
Author(s):  
H. Aoi ◽  
R. Tsuchiya ◽  
Y. Shiroishi ◽  
H. Matsuyama
Keyword(s):  
Thin Film ◽  
Magnetic Domain ◽  
Media Noise

Media noise of sputtered metallic thin film disks

1989 ◽  
Vol 4 (11) ◽  
pp. 680-691 ◽  
Author(s):  
N. Koga ◽  
S. Ito ◽  
H. Tomiyasu
Keyword(s):  
Thin Film ◽  
Media Noise ◽  
Metallic Thin Film

Effect of Microstructure on Dewetting Evolution in Polycrystalline Au Thin Film

2014 ◽  
Vol 52 (12) ◽  
pp. 1003-1008
Author(s):  
Yong-Jun Oh ◽  
Seon-Ah Jang ◽  
Hye-Jung Lee
Keyword(s):  
Thin Film ◽  
Effect Of Microstructure ◽  
Au Thin Film

Dependence of media noise on grain size and intergranular coupling in thin-film media

1996 ◽  
Vol 79 (8) ◽  
pp. 5339 ◽  
Author(s):  
Akira Kikuchi ◽  
Shinya Kawakita ◽  
Junichi Nakai ◽  
Takehito Shimatsu ◽  
Migaku Takahashi
Keyword(s):  
Thin Film ◽  
Grain Size ◽  
Media Noise

The Effects of Cross Hatch Angle (CHA) on Magnetic Properties and Read/Write Characteristics of CoCrPtTaB Thin Film Media

1994 ◽  
Vol 343 ◽  
Author(s):  
Ga-Lane Chen ◽  
H. Do ◽  
T.-A. Yeh ◽  
J. M. Sivertsen ◽  
J. H. Judy
Keyword(s):  
Thin Film ◽  
Magnetic Properties ◽  
Intensity Ratio ◽  
Media Industry ◽  
Signal Noise ◽  
Media Noise ◽  
Magnetic Performance ◽  
Squareness Ratio ◽  
The Relationship ◽  
Tribology Performance

ABSTRACTCross-hatch type texturing has been widely used to replace circumferential texturing in the thin film media industry for optimizing tribology performance. However, higher “cross hatch angle” (CHA) may degrade magnetic performance. The relationship between texturing cross hatch angle (CHA) and magnetic properties and their effects on the read/write characteristics of sputtered thin film media are discussed in this paper. As the CHA increases, both the orientation ratio (OR) and the squareness ratio “S(c)/S(r)” decrease. The film with the highest OR is located at CHA=90, which has the lowest media noise. The medium has highest signal/noise ratio when CHA is equal to 90. PW50 can decrease as much as 4 nanoseconds as CHA increases to 730. By calculating a ratio of the intensity of Cr (110) + CoCrPtTaB (0002) to the intensity of Cr (200), we are able to correlate the intensity ratio to magnetic properties and read/write characteristics.

Reduction of media noise in thin film metal media by lamination

1990 ◽  
Vol 26 (5) ◽  
pp. 2706-2708 ◽  
Author(s):  
S.E. Lambert ◽  
J.K. Howard ◽  
I.L. Sanders
Keyword(s):  
Thin Film ◽  
Media Noise
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