Reduction of media noise in thin film metal media by lamination

1990 ◽  
Vol 26 (5) ◽  
pp. 2706-2708 ◽  
Author(s):  
S.E. Lambert ◽  
J.K. Howard ◽  
I.L. Sanders
Keyword(s):  
Thin Film ◽  
Media Noise

A study on thin-film-media noise by magnetic domain observation

1988 ◽  
Vol 24 (6) ◽  
pp. 2715-2717 ◽  
Author(s):  
H. Aoi ◽  
R. Tsuchiya ◽  
Y. Shiroishi ◽  
H. Matsuyama
Keyword(s):  
Thin Film ◽  
Magnetic Domain ◽  
Media Noise

Effect of microstructure on media noise of CoCrTa thin film media fabricated under ultra clean sputtering process

1995 ◽  
Vol 31 (6) ◽  
pp. 2833-2835 ◽  
Author(s):  
J. Nakai ◽  
A. Kikuchi ◽  
M. Kuwabara ◽  
T. Sakurai ◽  
T. Shimatsu ◽  
...  
Keyword(s):  
Thin Film ◽  
Media Noise ◽  
Effect Of Microstructure

Media noise of sputtered metallic thin film disks

1989 ◽  
Vol 4 (11) ◽  
pp. 680-691 ◽  
Author(s):  
N. Koga ◽  
S. Ito ◽  
H. Tomiyasu
Keyword(s):  
Thin Film ◽  
Media Noise ◽  
Metallic Thin Film

Dependence of media noise on grain size and intergranular coupling in thin-film media

1996 ◽  
Vol 79 (8) ◽  
pp. 5339 ◽  
Author(s):  
Akira Kikuchi ◽  
Shinya Kawakita ◽  
Junichi Nakai ◽  
Takehito Shimatsu ◽  
Migaku Takahashi
Keyword(s):  
Thin Film ◽  
Grain Size ◽  
Media Noise

The Effects of Cross Hatch Angle (CHA) on Magnetic Properties and Read/Write Characteristics of CoCrPtTaB Thin Film Media

1994 ◽  
Vol 343 ◽  
Author(s):  
Ga-Lane Chen ◽  
H. Do ◽  
T.-A. Yeh ◽  
J. M. Sivertsen ◽  
J. H. Judy
Keyword(s):  
Thin Film ◽  
Magnetic Properties ◽  
Intensity Ratio ◽  
Media Industry ◽  
Signal Noise ◽  
Media Noise ◽  
Magnetic Performance ◽  
Squareness Ratio ◽  
The Relationship ◽  
Tribology Performance

ABSTRACTCross-hatch type texturing has been widely used to replace circumferential texturing in the thin film media industry for optimizing tribology performance. However, higher “cross hatch angle” (CHA) may degrade magnetic performance. The relationship between texturing cross hatch angle (CHA) and magnetic properties and their effects on the read/write characteristics of sputtered thin film media are discussed in this paper. As the CHA increases, both the orientation ratio (OR) and the squareness ratio “S(c)/S(r)” decrease. The film with the highest OR is located at CHA=90, which has the lowest media noise. The medium has highest signal/noise ratio when CHA is equal to 90. PW50 can decrease as much as 4 nanoseconds as CHA increases to 730. By calculating a ratio of the intensity of Cr (110) + CoCrPtTaB (0002) to the intensity of Cr (200), we are able to correlate the intensity ratio to magnetic properties and read/write characteristics.

Effect of track edge erasure and on-track percolation on media noise at high recording density in longitudinal thin film media

1997 ◽  
Vol 33 (5) ◽  
pp. 2992-2994 ◽  
Author(s):  
S.S. Malhotra ◽  
B.B. Lal ◽  
M. Alex ◽  
M.A. Russak
Keyword(s):  
Thin Film ◽  
Recording Density ◽  
Media Noise

REduction of media noise in thin film metal by lamination

1990 ◽  
Author(s):  
S.E. Lambert ◽  
J.K. Howard ◽  
I.L. Sanders
Keyword(s):  
Thin Film ◽  
Media Noise

The effect of cluster size on thin film media noise

1995 ◽  
Vol 31 (2) ◽  
pp. 1013-1024 ◽  
Author(s):  
J.J. Miles ◽  
M. Wdowin ◽  
J. Oakley ◽  
B.K. Middleton
Keyword(s):  
Thin Film ◽  
Cluster Size ◽  
Media Noise
Sign in / Sign up

Export Citation Format

Share Document