The role of electron traps on the post-stress interface trap generation in hot-carrier stressed p-MOSFETs
1999 ◽
Vol 46
(4)
◽
pp. 738-746
◽
1994 ◽
Vol 41
(3)
◽
pp. 413-419
◽
2006 ◽
Vol 27
(7)
◽
pp. 585-587
◽
Keyword(s):
Keyword(s):
2001 ◽
Vol 45
(10)
◽
pp. 1717-1723
◽