Three hot-carrier degradation mechanisms in deep-submicron PMOSFET's

R. Woltjer; G.M. Paulzen; H.G. Pomp; H. Lifka; P.H. Woerlee

doi:10.1109/16.370028

Three hot-carrier degradation mechanisms in deep-submicron PMOSFET's

IEEE Transactions on Electron Devices ◽

10.1109/16.370028 ◽

1995 ◽

Vol 42 (1) ◽

pp. 109-115 ◽

Cited By ~ 70

Author(s):

R. Woltjer ◽

G.M. Paulzen ◽

H.G. Pomp ◽

H. Lifka ◽

P.H. Woerlee

Keyword(s):

Deep Submicron ◽

Degradation Mechanisms ◽

Hot Carrier ◽

Hot Carrier Degradation

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Hot-carrier degradation mechanisms in silicon-On-Insulator MOSFETS

Microelectronics Reliability ◽

10.1016/s0026-2714(96)00262-4 ◽

1997 ◽

Vol 37 (7) ◽

pp. 1003-1013 ◽

Cited By ~ 17

Author(s):

Sorin Cristoloveanu

Keyword(s):

Silicon On Insulator ◽

Degradation Mechanisms ◽

Hot Carrier ◽

Hot Carrier Degradation

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The impact of scaling on hot-carrier degradation and supply voltage of deep-submicron NMOS transistors

International Electron Devices Meeting 1991 [Technical Digest] ◽

10.1109/iedm.1991.235338 ◽

2002 ◽

Cited By ~ 3

Author(s):

P. Woerlee ◽

P. Damink ◽

M. van Dort ◽

C. Juffermans ◽

C. de Kort ◽

...

Keyword(s):

Supply Voltage ◽

Deep Submicron ◽

Hot Carrier ◽

The Impact ◽

Nmos Transistors ◽

Hot Carrier Degradation

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Hot-carrier degradation study of high-density plasma (HDP) oxide deposition process in deep-submicron NMOSFETs

10.1117/12.361351 ◽

1999 ◽

Cited By ~ 1

Author(s):

Pei Yao ◽

Xu Zeng ◽

Keng F. Lo ◽

Qiang Guo ◽

Pee Y. Tan

Keyword(s):

Deposition Process ◽

Deep Submicron ◽

High Density ◽

Degradation Study ◽

Hot Carrier ◽

Oxide Deposition ◽

Density Plasma ◽

Hot Carrier Degradation

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Competing AC hot-carrier degradation mechanisms in surface-channel p-MOSFETs during pass transistor operation

International Electron Devices Meeting. Technical Digest ◽

10.1109/iedm.1996.554118 ◽

2002 ◽

Cited By ~ 3

Author(s):

A. Bravaix ◽

D. Vuillaume ◽

D. Goguenheim ◽

V. Lassarre ◽

M. Haoad

Keyword(s):

Degradation Mechanisms ◽

Hot Carrier ◽

Pass Transistor ◽

Hot Carrier Degradation

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Investigation on Channel Hot Carrier degradation of ultra deep submicron SOI pMOSFETs

2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology ◽

10.1109/icsict.2012.6466707 ◽

2012 ◽

Author(s):

Liang-Xi Huang ◽

Xia An ◽

Fei Tan ◽

Wei-Kang Wu ◽

Ru Huang

Keyword(s):

Deep Submicron ◽

Hot Carrier ◽

Hot Carrier Degradation

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Impact of E-E scattering to the hot carrier degradation of deep submicron NMOSFETs

IEEE Electron Device Letters ◽

10.1109/55.735747 ◽

1998 ◽

Vol 19 (12) ◽

pp. 463-465 ◽

Cited By ~ 67

Author(s):

S.E. Rauch ◽

F.J. Guarin ◽

G. LaRosa

Keyword(s):

Deep Submicron ◽

Hot Carrier ◽

Hot Carrier Degradation

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Role of E-E scattering in the enhancement of channel hot carrier degradation of deep-submicron NMOSFETs at high V/sub GS/ conditions

IEEE Transactions on Device and Materials Reliability ◽

10.1109/7298.956705 ◽

2001 ◽

Vol 1 (2) ◽

pp. 113-119 ◽

Cited By ~ 49

Author(s):

S.E. Rauch ◽

G. La Rosa ◽

F.J. Guarin

Keyword(s):

Deep Submicron ◽

Hot Carrier ◽

Hot Carrier Degradation

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Competing hot carrier degradation mechanisms in lateral n-type DMOS transistors

2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. ◽

10.1109/relphy.2003.1197748 ◽

2003 ◽

Cited By ~ 25

Author(s):

P. Moens ◽

G. Van den Bosch ◽

G. Groeseneken

Keyword(s):

Degradation Mechanisms ◽

Hot Carrier ◽

Hot Carrier Degradation

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3D TCAD Analysis of Hot-Carrier Degradation Mechanisms in 10 nm Node Input/Output Bulk FinFETs

JSTS Journal of Semiconductor Technology and Science ◽

10.5573/jsts.2016.16.2.191 ◽

2016 ◽

Vol 16 (2) ◽

pp. 191-197 ◽

Cited By ~ 1

Author(s):

Dokyun Son ◽

Sangbin Jeon ◽

Myounggon Kang ◽

Hyungcheol Shin

Keyword(s):

Degradation Mechanisms ◽

Input Output ◽

Hot Carrier ◽

Hot Carrier Degradation

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Hot carrier degradation mechanisms in sub-micron p channel MOSFETs: Impact on low frequency (1/f) noise behaviour

Microelectronics Reliability ◽

10.1016/s0026-2714(98)00143-7 ◽

1998 ◽

Vol 38 (6-8) ◽

pp. 931-936 ◽

Cited By ~ 2

Author(s):

E. Sheehan ◽

P.K. Hurley ◽

A. Mathewson

Keyword(s):

Low Frequency ◽

Degradation Mechanisms ◽

Hot Carrier ◽

Hot Carrier Degradation

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