Role of E-E scattering in the enhancement of channel hot carrier degradation of deep-submicron NMOSFETs at high V/sub GS/ conditions

2001 ◽  
Vol 1 (2) ◽  
pp. 113-119 ◽  
Author(s):  
S.E. Rauch ◽  
G. La Rosa ◽  
F.J. Guarin
Keyword(s):  
Deep Submicron ◽  
Hot Carrier ◽  
Hot Carrier Degradation

scholarly journals Modeling of hot-carrier degradation based on thorough carrier transport treatment

2014 ◽  
Vol 27 (4) ◽  
pp. 479-508 ◽  
Author(s):  
Stanislav Tyaginov ◽  
Yannick Wimmer ◽  
Tibor Grasser
Keyword(s):  
Electron Scattering ◽  
Carrier Transport ◽  
Drain Current ◽  
Boltzmann Transport ◽  
Hot Carrier ◽  
Statistical Fluctuations ◽  
Channel Gate ◽  
Current Change ◽  
Hot Carrier Degradation

We present and validate a physics-basedmodel for hot-carrier degradation. The model is based on a thorough carrier transport treatment by means of an exact solution of the Boltzmann transport equation. Such important ingredients relevant for hot-carrier degradation as the competing mechanisms of bond dissociation, electron-electron scattering, the activation energy reduction due to the interaction of the dipole moment of the bond with the electric field as well as statistical fluctuations of this energy are incorporated in our approach. The model is validated in order to represent the linear drain current change in three different devices subjected to hot-carrier stress under different conditions. The main demand is that the model has to use a unique set of parameters. We analyze the importance of all the model ingredients, especially the role of electron-electron scattering. We check the idea that the channel/gate length of the device alone is not enough to judge whether electron-electron scattering is important or not and instead a combination of the device topology and stress conditions needs to be used.

The role of cold carriers and the multiple-carrier process of Si–H bond dissociation for hot-carrier degradation in n- and p-channel LDMOS devices

2016 ◽  
Vol 115 ◽  
pp. 185-191 ◽  
Author(s):  
Prateek Sharma ◽  
Stanislav Tyaginov ◽  
Markus Jech ◽  
Yannick Wimmer ◽  
Florian Rudolf ◽  
...  
Keyword(s):  
Hot Carrier ◽  
Bond Dissociation ◽  
Hot Carrier Degradation

Impact of E-E scattering to the hot carrier degradation of deep submicron NMOSFETs

1998 ◽  
Vol 19 (12) ◽  
pp. 463-465 ◽  
Author(s):  
S.E. Rauch ◽  
F.J. Guarin ◽  
G. LaRosa
Keyword(s):  
Deep Submicron ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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