Measurements of the quantum-confined conduction band energy in the wetting layer surrounding individualIn0.4Ga0.6Asquantum dots by cross-sectional ballistic electron emission microscopy

2010 ◽  
Vol 82 (3) ◽  
Author(s):  
C. Marginean ◽  
J. P. Pelz ◽  
S. Y. Lehman ◽  
J. G. Cederberg
Keyword(s):  
Conduction Band ◽  
Electron Emission ◽  
Wetting Layer ◽  
Ballistic Electron Emission Microscopy ◽  
Cross Sectional ◽  
Band Energy ◽  
Ballistic Electron ◽  
Emission Microscopy ◽  
Quantum Confined

The Effect of Strain Relaxation Mechanisms on the Electrical Properties of Epitaxial CaF2/Si(111) Heterostructures

1996 ◽  
Vol 466 ◽  
Author(s):  
L. J. Schowalter ◽  
B. M. Kim ◽  
T. G. Thundat ◽  
Carl A. Ventrice ◽  
V. P. LaBella
Keyword(s):  
Electrical Properties ◽  
Electron Emission ◽  
Electron Tunneling ◽  
Strain Relaxation ◽  
Wetting Layer ◽  
Ballistic Electron Emission Microscopy ◽  
Preliminary Results ◽  
Ballistic Electron ◽  
Emission Microscopy ◽  
A New Technique

ABSTRACTA new technique for growth of exactly two monolayers of CaF2 on Si(111) substrates is demonstrated. This technique takes advantage of the tendency of CaF2 to form thick islands at Si step edges on vicinal substrates once a two-monolayer thick wetting layer is deposited. A comparison of I-V characteristics for epitaxial CaF2 layers grown on on-axis versus off-axis substrates demonstrates the advantages of this technique. In addition, preliminary results for electron tunneling through the CaF2 structure is shown using the ballistic electron emission microscopy (BEEM) technique.

Conduction band offsets in ordered‐GaInP/GaAs heterostructures studied by ballistic‐electron‐emission microscopy

1996 ◽  
Vol 69 (20) ◽  
pp. 3022-3024 ◽  
Author(s):  
J. J. O’Shea ◽  
C. M. Reaves ◽  
S. P. DenBaars ◽  
M. A. Chin ◽  
V. Narayanamurti
Keyword(s):  
Conduction Band ◽  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Band Offsets ◽  
Ballistic Electron ◽  
Emission Microscopy

scholarly journals Theory of ballistic electron emission microscopy

2001 ◽  
Vol 66 (1-2) ◽  
pp. 3-51 ◽  
Author(s):  
P.L. de Andres ◽  
F.J. Garcia-Vidal ◽  
K. Reuter ◽  
F. Flores
Keyword(s):  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy
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