Energy-dependent conduction band mass of SiO[sub 2] determined by ballistic electron emission microscopy

1999 ◽  
Vol 17 (4) ◽  
pp. 1823 ◽  
Author(s):  
R. Ludeke ◽  
Andreas Schenk
Keyword(s):  
Conduction Band ◽  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy ◽  
Energy Dependent

Conduction band offsets in ordered‐GaInP/GaAs heterostructures studied by ballistic‐electron‐emission microscopy

1996 ◽  
Vol 69 (20) ◽  
pp. 3022-3024 ◽  
Author(s):  
J. J. O’Shea ◽  
C. M. Reaves ◽  
S. P. DenBaars ◽  
M. A. Chin ◽  
V. Narayanamurti
Keyword(s):  
Conduction Band ◽  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Band Offsets ◽  
Ballistic Electron ◽  
Emission Microscopy

scholarly journals Theory of ballistic electron emission microscopy

2001 ◽  
Vol 66 (1-2) ◽  
pp. 3-51 ◽  
Author(s):  
P.L. de Andres ◽  
F.J. Garcia-Vidal ◽  
K. Reuter ◽  
F. Flores
Keyword(s):  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Observation of misfit dislocations at the InxGa1−xAs/GaAs interface by ballistic‐electron‐emission microscopy

1996 ◽  
Vol 69 (7) ◽  
pp. 940-942 ◽  
Author(s):  
E. Y. Lee ◽  
S. Bhargava ◽  
M. A. Chin ◽  
V. Narayanamurti ◽  
K. J. Pond ◽  
...  
Keyword(s):  
Electron Emission ◽  
Misfit Dislocations ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy
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