Conduction band offsets in ordered‐GaInP/GaAs heterostructures studied by ballistic‐electron‐emission microscopy

J. J. O’Shea; C. M. Reaves; S. P. DenBaars; M. A. Chin; V. Narayanamurti

doi:10.1063/1.116826

Conduction band offsets in ordered‐GaInP/GaAs heterostructures studied by ballistic‐electron‐emission microscopy

Applied Physics Letters ◽

10.1063/1.116826 ◽

1996 ◽

Vol 69 (20) ◽

pp. 3022-3024 ◽

Cited By ~ 43

Author(s):

J. J. O’Shea ◽

C. M. Reaves ◽

S. P. DenBaars ◽

M. A. Chin ◽

V. Narayanamurti

Keyword(s):

Conduction Band ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Band Offsets ◽

Ballistic Electron ◽

Emission Microscopy

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Direct observation of conduction-band structure of4H- and6H−SiCusing ballistic electron emission microscopy

Physical Review B ◽

10.1103/physrevb.57.4027 ◽

1998 ◽

Vol 57 (7) ◽

pp. 4027-4032 ◽

Cited By ~ 33

Author(s):

B. Kaczer ◽

H.-J. Im ◽

J. P. Pelz ◽

J. Chen ◽

W. J. Choyke

Keyword(s):

Band Structure ◽

Conduction Band ◽

Direct Observation ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Conduction band energies and hot-electron transport characteristics of epitaxial Sc2O3∕Si (111) studied by ballistic electron emission microscopy and internal photoemission

Applied Physics Letters ◽

10.1063/1.2757150 ◽

2007 ◽

Vol 91 (4) ◽

pp. 042901 ◽

Cited By ~ 8

Author(s):

W. Cai ◽

S. E. Stone ◽

J. P. Pelz ◽

L. F. Edge ◽

D. G. Schlom

Keyword(s):

Electron Transport ◽

Conduction Band ◽

Electron Emission ◽

Hot Electron ◽

Ballistic Electron Emission Microscopy ◽

Internal Photoemission ◽

Ballistic Electron ◽

Emission Microscopy ◽

Hot Electron Transport

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Nanometer-Scale Investigation of Schottky Contacts and Conduction Band Structure on 4H-, 6H- and 15R-SiC Using Ballistic Electron Emission Microscopy

Materials Science Forum ◽

10.4028/www.scientific.net/msf.264-268.813 ◽

1998 ◽

Vol 264-268 ◽

pp. 813-816 ◽

Cited By ~ 4

Author(s):

Hyoung Jin Im ◽

B. Kaczer ◽

J.P. Pelz ◽

Jin Ming Chen ◽

Wolfgang J. Choyke

Keyword(s):

Band Structure ◽

Conduction Band ◽

Electron Emission ◽

Schottky Contacts ◽

Nanometer Scale ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Measurements of the quantum-confined conduction band energy in the wetting layer surrounding individualIn0.4Ga0.6Asquantum dots by cross-sectional ballistic electron emission microscopy

Physical Review B ◽

10.1103/physrevb.82.035304 ◽

2010 ◽

Vol 82 (3) ◽

Cited By ~ 2

Author(s):

C. Marginean ◽

J. P. Pelz ◽

S. Y. Lehman ◽

J. G. Cederberg

Keyword(s):

Conduction Band ◽

Electron Emission ◽

Wetting Layer ◽

Ballistic Electron Emission Microscopy ◽

Cross Sectional ◽

Band Energy ◽

Ballistic Electron ◽

Emission Microscopy ◽

Quantum Confined

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Energy-dependent conduction band mass of SiO[sub 2] determined by ballistic electron emission microscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.590833 ◽

1999 ◽

Vol 17 (4) ◽

pp. 1823 ◽

Cited By ~ 8

Author(s):

R. Ludeke ◽

Andreas Schenk

Keyword(s):

Conduction Band ◽

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy ◽

Energy Dependent

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Measurement of heterojunction band offsets using ballistic electron emission microscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.587221 ◽

1994 ◽

Vol 12 (4) ◽

pp. 2625 ◽

Cited By ~ 28

Author(s):

J. J. O’Shea

Keyword(s):

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Band Offsets ◽

Ballistic Electron ◽

Emission Microscopy

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Theory of ballistic electron emission microscopy

Progress in Surface Science ◽

10.1016/s0079-6816(00)00022-8 ◽

2001 ◽

Vol 66 (1-2) ◽

pp. 3-51 ◽

Cited By ~ 37

Author(s):

P.L. de Andres ◽

F.J. Garcia-Vidal ◽

K. Reuter ◽

F. Flores

Keyword(s):

Electron Emission ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Ballistic electron emission microscopy investigation of SiGe nanostructures fabricated using reactive-ion etching

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.585939 ◽

1992 ◽

Vol 10 (6) ◽

pp. 3112 ◽

Cited By ~ 8

Author(s):

J. G. Couillard

Keyword(s):

Electron Emission ◽

Reactive Ion Etching ◽

Ballistic Electron Emission Microscopy ◽

Ion Etching ◽

Ballistic Electron ◽

Microscopy Investigation ◽

Emission Microscopy

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Observation of misfit dislocations at the InxGa1−xAs/GaAs interface by ballistic‐electron‐emission microscopy

Applied Physics Letters ◽

10.1063/1.116950 ◽

1996 ◽

Vol 69 (7) ◽

pp. 940-942 ◽

Cited By ~ 11

Author(s):

E. Y. Lee ◽

S. Bhargava ◽

M. A. Chin ◽

V. Narayanamurti ◽

K. J. Pond ◽

...

Keyword(s):

Electron Emission ◽

Misfit Dislocations ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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Comparison of the spatial variation in the barrier height of Si and GaAs Schottky diodes as measured by ballistic electron emission microscopy

Control of Semiconductor Interfaces ◽

10.1016/b978-0-444-81889-8.50048-1 ◽

1994 ◽

pp. 261-266

Author(s):

Karen L. Kavanag ◽

A. Alec Talin ◽

Brent A. Morgan ◽

R. Stanley Williams ◽

Ken Ring

Keyword(s):

Spatial Variation ◽

Barrier Height ◽

Electron Emission ◽

Schottky Diodes ◽

Ballistic Electron Emission Microscopy ◽

Ballistic Electron ◽

Emission Microscopy

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