Direct observation of conduction-band structure of4H- and6H−SiCusing ballistic electron emission microscopy

1998 ◽  
Vol 57 (7) ◽  
pp. 4027-4032 ◽  
Author(s):  
B. Kaczer ◽  
H.-J. Im ◽  
J. P. Pelz ◽  
J. Chen ◽  
W. J. Choyke
1999 ◽  
Vol 75 (8) ◽  
pp. 1128-1130 ◽  
Author(s):  
M. Kozhevnikov ◽  
V. Narayanamurti ◽  
A. Mascarenhas ◽  
Y. Zhang ◽  
J. M. Olson ◽  
...  

1998 ◽  
Vol 93 (2) ◽  
pp. 281-287
Author(s):  
P.L. de Andres ◽  
K. Reuter ◽  
F.J. Garcia-Vidal ◽  
F. Flores ◽  
U. Hohenester ◽  
...  

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