Direct observation of conduction-band structure of4H- and6H−SiCusing ballistic electron emission microscopy
1998 ◽
Vol 264-268
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pp. 813-816
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1998 ◽
Vol 81
(22)
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pp. 4963-4966
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1999 ◽
Vol 17
(4)
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pp. 1823
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1988 ◽
Vol 61
(20)
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pp. 2368-2371
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1995 ◽
Vol 74
(17)
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pp. 3427-3430
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