Epitaxial growth of Ge films on GaAs (285–415 °C) by laser photochemical vapor deposition

1988 ◽  
Vol 52 (20) ◽  
pp. 1710-1712 ◽  
Author(s):  
V. Tavitian ◽  
C. J. Kiely ◽  
D. B. Geohegan ◽  
J. G. Eden
1989 ◽  
Vol 55 (1) ◽  
pp. 65-67 ◽  
Author(s):  
C. J. Kiely ◽  
V. Tavitian ◽  
C. Jones ◽  
J. G. Eden

1986 ◽  
Vol 49 (2) ◽  
pp. 79-81 ◽  
Author(s):  
Shoji Nishida ◽  
Tsunenori Shiimoto ◽  
Akira Yamada ◽  
Shiro Karasawa ◽  
Makoto Konagai ◽  
...  

1986 ◽  
Vol 71 ◽  
Author(s):  
M. Konagai ◽  
S. Nishida ◽  
A. Yamada ◽  
T. Shiimoto ◽  
S. Karasawa ◽  
...  

AbstractA new technique for silicon epitaxial growth has been developed using mercury—sensitized photochemical vapor deposition (photo—CVD). Epitaxial thin layers were grown on (100) Si substrates at 100–300ºC from a gas mixture of Si2H6+AiH2F2+H2 by irradiation of a low pressure mercury lamp (1849A, 2537A). Refiective high energy electron diffraction (RHEED) and Raman scattering measurements showed that the epitaxial layers had good crystallinities.The epitaxial layers were characterized by secondary ion mass spectroscopy (SIMS) and the van der Pauw Hall2 measurements. The undoped Si layer showed the electron mobility of 520cm2/Vs with a carrier concentration of 3.2xl04cm


1987 ◽  
Vol 26 (Part 2, No. 7) ◽  
pp. L1189-L1192 ◽  
Author(s):  
Narishi Gonohe ◽  
Saburo Shimizu ◽  
Kouichi Tamagawa ◽  
Toshio Hayashi ◽  
Hiroyuki Yamakawa

1983 ◽  
Vol 59-60 ◽  
pp. 715-718 ◽  
Author(s):  
Tadashi Saitoh ◽  
Toshikazu Shimada ◽  
Masataka Migitaka ◽  
Yasuo Tarui

1990 ◽  
Vol 46 (1-4) ◽  
pp. 215-219 ◽  
Author(s):  
J. Elders ◽  
D. Bebelaar ◽  
J.D.W. van Voorst

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