scholarly journals Erratum: Calculation of critical layer thickness versus lattice mismatch for GexSi1−x/Si strained‐layer heterostructures [Appl. Phys. Lett. 47, 322 (1985)]

1986 ◽  
Vol 49 (4) ◽  
pp. 229-229 ◽  
Author(s):  
R. People ◽  
J. C. Bean
Keyword(s):  
Layer Thickness ◽  
Lattice Mismatch ◽  
Critical Layer ◽  
Critical Layer Thickness ◽  
Strained Layer

Controversy of critical layer thickness for InGaAs/GaAs strained‐layer epitaxy

1988 ◽  
Vol 52 (5) ◽  
pp. 377-379 ◽  
Author(s):  
P. L. Gourley ◽  
I. J. Fritz ◽  
L. R. Dawson
Keyword(s):  
Layer Thickness ◽  
Critical Layer ◽  
Critical Layer Thickness ◽  
Strained Layer

Dependence of critical layer thickness on strain for InxGa1−xAs/GaAs strained‐layer superlattices

1985 ◽  
Vol 46 (10) ◽  
pp. 967-969 ◽  
Author(s):  
I. J. Fritz ◽  
S. T. Picraux ◽  
L. R. Dawson ◽  
T. J. Drummond ◽  
W. D. Laidig ◽  
...  
Keyword(s):  
Layer Thickness ◽  
Critical Layer ◽  
Critical Layer Thickness ◽  
Strained Layer ◽  
Strained Layer Superlattices
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