Reactivity and interface chemistry during Schottky‐barrier formations: Metals on thin native oxides of GaAs investigated by x‐ray photoelectron spectroscopy

1981 ◽  
Vol 38 (3) ◽  
pp. 167-169 ◽  
Author(s):  
Steven P. Kowalczyk ◽  
J. R. Waldrop ◽  
R. W. Grant
Keyword(s):  
Schottky Barrier ◽  
Photoelectron Spectroscopy ◽  
Interface Chemistry ◽  
X Ray ◽  
Native Oxides

Chemical Structures of Native Oxides Formed During Wet Chemical Treatments on NH4F Treated Si(111) Surfaces

1992 ◽  
Vol 259 ◽  
Author(s):  
Takeo Hattori ◽  
Hiroki Ogawa
Keyword(s):  
Photoelectron Spectroscopy ◽  
Attenuated Total Reflection ◽  
Native Oxide ◽  
X Ray ◽  
Chemical Treatments ◽  
Chemical Structures ◽  
Native Oxides ◽  
Ft Ir ◽  
Wet Chemical ◽  
Silicon Interface

ABSTRACTChemical structures of native oxides formed during wet chemical treatments on NH4F treated Si(111) surfaces were investigated using X-ray Photoelectron Spectroscopy (XPS) and Fourier Transformed Infrared Attenuated Total Reflection(FT-IR-ATR). It was found that the amounts of Si-H bonds in native oxides and those at native oxide/silicon interface are negligibly small in the case of native oxides formed in H2SO4-H2O2-H2O solution. Based on this discovery, it was confirmed that native oxides can be characterized by the amount of Si-H bonds in native oxides. Furthermore, it was found that the combination of various wet chemical treatments with the treatment in NH4OH-H2O2-H2O solution results in the drastic decrease in the amount of Si-H bonds in native oxides.

X-ray Photoelectron Spectroscopy Investigation of the Schottky Barrier at a-BN:H∕Cu Interfaces

2011 ◽  
Vol 14 (12) ◽  
pp. H478 ◽  
Author(s):  
S. W. King ◽  
M. French ◽  
J. Bielefeld ◽  
M. Jaehnig ◽  
M. Kuhn ◽  
...  
Keyword(s):  
Schottky Barrier ◽  
Photoelectron Spectroscopy ◽  
X Ray

An X‐Ray Photoelectron Spectroscopy Study of Native Oxides on GaAs

1979 ◽  
Vol 126 (10) ◽  
pp. 1737-1749 ◽  
Author(s):  
G. P. Schwartz ◽  
G. J. Gualtieri ◽  
G. W. Kammlott ◽  
B. Schwartz
Keyword(s):  
Photoelectron Spectroscopy ◽  
Spectroscopy Study ◽  
X Ray ◽  
Native Oxides

X-ray photoelectron spectroscopy investigation of the Schottky barrier at low-k a-SiO(C):H/Cu interfaces

2011 ◽  
Vol 99 (20) ◽  
pp. 202903 ◽  
Author(s):  
S. W. King ◽  
M. French ◽  
M. Jaehnig ◽  
M. Kuhn ◽  
B. French
Keyword(s):  
Schottky Barrier ◽  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Low K

Native oxides on etched Zn3P2surfaces studied by x‐ray photoelectron spectroscopy

1988 ◽  
Vol 52 (25) ◽  
pp. 2133-2135 ◽  
Author(s):  
Yoshimine Kato ◽  
Shoichi Kurita
Keyword(s):  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Native Oxides

scholarly journals Quantitative Characterisation of Surface and Interface Chemistry with X-ray Photoelectron Spectroscopy (XPS)

2009 ◽  
Vol 15 (S2) ◽  
pp. 176-177
Author(s):  
TS Nunney ◽  
O Mustonen ◽  
RG White
Keyword(s):  
Photoelectron Spectroscopy ◽  
Interface Chemistry ◽  
X Ray ◽  
Surface And Interface ◽  
Quantitative Characterisation

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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