Influence of impurity concentration in Ge sources on electrical properties of Ge/Si hetero-junction tunneling field-effect transistors

2018 ◽  
Vol 113 (6) ◽  
pp. 062103 ◽  
Author(s):  
Tae-Eon Bae ◽  
Kimihiko Kato ◽  
Ryota Suzuki ◽  
Ryosho Nakane ◽  
Mitsuru Takenaka ◽  
...  
2019 ◽  
Vol 125 (19) ◽  
pp. 195701 ◽  
Author(s):  
Kimihiko Kato ◽  
Hiroaki Matsui ◽  
Hitoshi Tabata ◽  
Mitsuru Takenaka ◽  
Shinichi Takagi

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