scholarly journals S2DS: Physics-based compact model for circuit simulation of two-dimensional semiconductor devices including non-idealities

2016 ◽  
Vol 120 (22) ◽  
pp. 224503 ◽  
Author(s):  
Saurabh V. Suryavanshi ◽  
Eric Pop
Keyword(s):  
Circuit Simulation ◽  
Semiconductor Devices ◽  
Compact Model ◽  
Two Dimensional

A Novel Junction Profiling Methodology

2010 ◽  
Author(s):  
Tomokazu Nakai
Keyword(s):  
Failure Analysis ◽  
Profile Analysis ◽  
Semiconductor Devices ◽  
Wet Etching ◽  
Two Dimensional ◽  
Electrical Characteristics ◽  
Conventional Methods

Abstract Currently many methods are available to obtain a junction profile of semiconductor devices, but the conventional methods have drawbacks, and they could be obstacles for junction profile analysis. This paper introduces an anodic wet etching-based two-dimensional junction profiling method, which is practical, efficient, and reliable for failure analysis and electrical characteristics evaluation.

scholarly journals Comprehensive Phase-Change Memory Compact Model for Circuit Simulation

2018 ◽  
Vol 65 (10) ◽  
pp. 4282-4289 ◽  
Author(s):  
Corentin Pigot ◽  
Marc Bocquet ◽  
Fabien Gilibert ◽  
Marina Reyboz ◽  
Olga Cueto ◽  
...  
Keyword(s):  
Phase Change ◽  
Circuit Simulation ◽  
Phase Change Memory ◽  
Compact Model ◽  
Change Memory

scholarly journals Modeling Emerging Semiconductor Devices for Circuit Simulation

2020 ◽  
Author(s):  
Md Sakib Hasan ◽  
Mst Shamim Ara Shawkat ◽  
Sherif Amer ◽  
Syed Kamrul Islam ◽  
Nicole McFarlane ◽  
...  
Keyword(s):  
Circuit Simulation ◽  
Semiconductor Devices
Sign in / Sign up

Export Citation Format

Share Document