Unipolar poling-induced high switching speed and improved imprint behaviors for poly(vinylidene fluoride-trifluoroethylene) copolymer ultrathin films

2013 ◽  
Vol 103 (26) ◽  
pp. 263503 ◽  
Author(s):  
Ying Hou ◽  
Zhaoyue Lü ◽  
Tiansong Pu ◽  
Yuan Zhang ◽  
Xiangjian Meng ◽  
...  
Membranes ◽  
2021 ◽  
Vol 11 (5) ◽  
pp. 301
Author(s):  
Xingjia Li ◽  
Zhi Shi ◽  
Xiuli Zhang ◽  
Xiangjian Meng ◽  
Zhiqiang Huang ◽  
...  

The effect of testing temperature and storage period on the polarization fatigue properties of poly (vinylidene fluoride-trifluoroethylene) (P(VDF–TrFE)) ultrathin film devices were investigated. The experimental results show that, even after stored in air for 150 days, the relative remanent polarization (Pr/Pr(0)) of P(VDF–TrFE) of ultrathin films can keep at a relatively high level of 0.80 at 25 °C and 0.70 at 60 °C. To account for this result, a hydrogen fluoride (HF) formation inhibition mechanism was proposed, which correlated the testing temperature and the storage period with the microstructure of P(VDF–TrFE) molecular chain. Moreover, a theoretical model was constructed to describe the polarization fatigue evolution of P(VDF–TrFE) samples.


2001 ◽  
Vol 665 ◽  
Author(s):  
Feng Xia ◽  
H.S. Xu ◽  
Babak Razavi ◽  
Q. M. Zhang

ABSTRACTFerroelectric polymer thin films are attractive for a wide range of applications such as MEMS, IR sensors, and memory devices. We present the results of a recent investigation on the thickness dependence of the ferroelectric properties of poly(vinylidene fluoridetrifluoroethylene) copolymer spin cast films on electroded Si substrate. We show that as the film thickness is reduced, there exist two thickness regions. For films at thickness above 100 nm, the thickness dependence of the ferroelectric properties can be attributed to the interface effect. However, for thinner films, there is a large change in the ferroelectric properties such as the polarization level, the coercive field, and polarization switching speed, which is related to the large drop of the crystallinity in the ultrathin film region (below 100 nm). The results from Xray, dielectric measurement, and AFM all indicate that there is a threshold thickness at about 100 nm below which the crystallinity in the film reduces abruptly.


2014 ◽  
Vol 104 (10) ◽  
pp. 103505 ◽  
Author(s):  
Xiuli Zhang ◽  
Xiaoli Du ◽  
Ying Hou ◽  
Zhaoyue Lü ◽  
Haisheng Xu

Polymers ◽  
2017 ◽  
Vol 10 (1) ◽  
pp. 6 ◽  
Author(s):  
Long Li ◽  
Xiuli Zhang ◽  
Hongzhen Chen ◽  
Xiaohui Sun ◽  
Haidong Yuan ◽  
...  

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