Conductive atomic force microscopy study of single molecule electron transport through the Azurin-gold nanoparticle system

2013 ◽  
Vol 102 (20) ◽  
pp. 203704 ◽  
Author(s):  
Samuele Raccosta ◽  
Chiara Baldacchini ◽  
Anna Rita Bizzarri ◽  
Salvatore Cannistraro
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Transport ◽  
Gold Nanoparticle ◽  
Single Molecule ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoparticle System

A Single-Molecule Atomic Force Microscopy Study of PARP1 and PARP2 Recognition of Base Excision Repair DNA Intermediates

2019 ◽  
Vol 431 (15) ◽  
pp. 2655-2673 ◽  
Author(s):  
Maria V. Sukhanova ◽  
Loic Hamon ◽  
Mikhail M. Kutuzov ◽  
Vandana Joshi ◽  
Sanae Abrakhi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Base Excision Repair ◽  
Single Molecule ◽  
Excision Repair ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force ◽  
Base Excision

A single-molecule atomic force microscopy study reveals the antiviral mechanism of tannin and its derivatives

Nanoscale ◽  
2019 ◽  
Vol 11 (35) ◽  
pp. 16368-16376
Author(s):  
Huijie Wang ◽  
Ying Chen ◽  
Wenke Zhang
Keyword(s):  
Atomic Force Microscopy ◽  
Single Molecule ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force ◽  
Antiviral Mechanism

We explore the antiviral mechanism of tannin and its derivatives on TMV using single-molecule atomic force microscopy.

Conductive atomic force microscopy study of InGaN films grown by hot-wall epitaxy with a mixed (Ga+In) source

2000 ◽  
Vol 88 (3) ◽  
pp. 1670-1673 ◽  
Author(s):  
Futoshi Iwata ◽  
Shucheng Chu ◽  
Akira Sasaki ◽  
Kenji Ishino ◽  
Akihiro Ishida ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Hot Wall Epitaxy

Conductive atomic force microscopy study of silica nanotrench structure

2007 ◽  
Vol 90 (4) ◽  
pp. 042106 ◽  
Author(s):  
Z. G. Sun ◽  
H. Kuramochi ◽  
H. Akinaga ◽  
H. H. Yu ◽  
E. D. Gu
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force
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