Conductive atomic force microscopy study of InGaN films grown by hot-wall epitaxy with a mixed (Ga+In) source

2000 ◽  
Vol 88 (3) ◽  
pp. 1670-1673 ◽  
Author(s):  
Futoshi Iwata ◽  
Shucheng Chu ◽  
Akira Sasaki ◽  
Kenji Ishino ◽  
Akihiro Ishida ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Hot Wall Epitaxy

Conductive atomic force microscopy study of silica nanotrench structure

2007 ◽  
Vol 90 (4) ◽  
pp. 042106 ◽  
Author(s):  
Z. G. Sun ◽  
H. Kuramochi ◽  
H. Akinaga ◽  
H. H. Yu ◽  
E. D. Gu
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Conductive Atomic Force Microscopy Study of Doped Tin Oxide Thin Film

2010 ◽  
Vol 16 (S2) ◽  
pp. 1562-1563
Author(s):  
L Fang ◽  
R Korotkov
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Tin Oxide ◽  
Microscopy Study ◽  
Oxide Thin Film ◽  
Atomic Force Microscopy Study ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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