Role of Cu on the electrical properties of CdTe∕CdS solar cells: A cross-sectional conductive atomic force microscopy study

2007 ◽  
Vol 25 (2) ◽  
pp. 361 ◽  
Author(s):  
H. R. Moutinho ◽  
R. G. Dhere ◽  
C.-S. Jiang ◽  
T. Gessert ◽  
A. Duda ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Electrical Properties ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Conductive Atomic Force Microscopy ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Atomic Force

Conductive atomic force microscopy study of InGaN films grown by hot-wall epitaxy with a mixed (Ga+In) source

2000 ◽  
Vol 88 (3) ◽  
pp. 1670-1673 ◽  
Author(s):  
Futoshi Iwata ◽  
Shucheng Chu ◽  
Akira Sasaki ◽  
Kenji Ishino ◽  
Akihiro Ishida ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Hot Wall Epitaxy
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