Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

Paloma Tejedor; Laura Díez-Merino; Igor Beinik; Christian Teichert

doi:10.1063/1.3232234

Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)

Applied Physics Letters ◽

10.1063/1.3232234 ◽

2009 ◽

Vol 95 (12) ◽

pp. 123103 ◽

Cited By ~ 10

Author(s):

Paloma Tejedor ◽

Laura Díez-Merino ◽

Igor Beinik ◽

Christian Teichert

Keyword(s):

Atomic Force Microscopy ◽

Growth Kinetics ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Morphology and Growth Kinetics of Alzheimer’S Amyloid β- Peptides, Aβ and the ARCTIC Mutation Aβ (E22G): In Situ Atomic Force Microscopy Study

Amyloid and Amyloidosis ◽

10.1201/9781420037494-145 ◽

2004 ◽

pp. 408-410

Author(s):

M. Hellberg ◽

N. Norlin ◽

O. N. Antzutkin ◽

N. Almqvist

Keyword(s):

Atomic Force Microscopy ◽

Growth Kinetics ◽

Amyloid Β ◽

Microscopy Study ◽

The Arctic ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Kinetics Of

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Conductive atomic force microscopy study of plastocyanin molecules adsorbed on gold electrode

Surface Science ◽

10.1016/j.susc.2005.08.027 ◽

2005 ◽

Vol 598 (1-3) ◽

pp. 68-77 ◽

Cited By ~ 21

Author(s):

Laura Andolfi ◽

Salvatore Cannistraro

Keyword(s):

Atomic Force Microscopy ◽

Gold Electrode ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Conductive atomic force microscopy study of self-assembled silicon nanostructures

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.3258147 ◽

2009 ◽

Vol 27 (6) ◽

pp. 3051 ◽

Cited By ~ 5

Author(s):

M. R. Bari ◽

R. J. Blaikie ◽

F. Fang ◽

A. Markwitz

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Silicon Nanostructures ◽

Atomic Force Microscopy Study ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Self Assembled

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Conductive-atomic force microscopy study of local electron transport in nanostructured titanium nitride thin films

Thin Solid Films ◽

10.1016/j.tsf.2011.05.052 ◽

2011 ◽

Vol 519 (22) ◽

pp. 7702-7706 ◽

Cited By ~ 14

Author(s):

K. Vasu ◽

M. Ghanashyam Krishna ◽

K.A. Padmanabhan

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Electron Transport ◽

Titanium Nitride ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Local Electron ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Conductive atomic force microscopy study of InGaN films grown by hot-wall epitaxy with a mixed (Ga+In) source

Journal of Applied Physics ◽

10.1063/1.373869 ◽

2000 ◽

Vol 88 (3) ◽

pp. 1670-1673 ◽

Cited By ~ 6

Author(s):

Futoshi Iwata ◽

Shucheng Chu ◽

Akira Sasaki ◽

Kenji Ishino ◽

Akihiro Ishida ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Hot Wall Epitaxy

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Conductive atomic force microscopy study of MBE GaN films

10.1117/12.658045 ◽

2006 ◽

Cited By ~ 3

Author(s):

J. C. Moore ◽

K. A. Cooper ◽

J. Xie ◽

H. Morkoç ◽

A. A. Baski

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Atomic force microscopy study of growth kinetics: Scaling in TiN–TiB2 nanocomposite films on Si(100)

Applied Surface Science ◽

10.1016/j.apsusc.2005.10.027 ◽

2006 ◽

Vol 252 (23) ◽

pp. 8091-8095 ◽

Cited By ~ 2

Author(s):

K. Chu ◽

Z.-J. Liu ◽

Y.H. Lu ◽

Y.G. Shen

Keyword(s):

Atomic Force Microscopy ◽

Growth Kinetics ◽

Microscopy Study ◽

Nanocomposite Films ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force

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Conductive atomic force microscopy study of silica nanotrench structure

Applied Physics Letters ◽

10.1063/1.2436709 ◽

2007 ◽

Vol 90 (4) ◽

pp. 042106 ◽

Cited By ~ 2

Author(s):

Z. G. Sun ◽

H. Kuramochi ◽

H. Akinaga ◽

H. H. Yu ◽

E. D. Gu

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Role of Cu on the electrical properties of CdTe∕CdS solar cells: A cross-sectional conductive atomic force microscopy study

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.2699923 ◽

2007 ◽

Vol 25 (2) ◽

pp. 361 ◽

Cited By ~ 15

Author(s):

H. R. Moutinho ◽

R. G. Dhere ◽

C.-S. Jiang ◽

T. Gessert ◽

A. Duda ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Solar Cells ◽

Electrical Properties ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Conductive Atomic Force Microscopy ◽

Cross Sectional ◽

Force Microscopy ◽

Atomic Force

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Conductive atomic force microscopy study of the photoexcitation effect on resistive switching in ZrO2(Y) films with Au nanoparticles

Journal of Physics Conference Series ◽

10.1088/1742-6596/993/1/012026 ◽

2018 ◽

Vol 993 ◽

pp. 012026

Author(s):

A S Novikov ◽

D O Filatov ◽

D A Antonov ◽

I N Antonov ◽

M E Shenina ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Resistive Switching ◽

Au Nanoparticles ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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