Conductive atomic force microscopy study of self-assembled silicon nanostructures

2009 ◽  
Vol 27 (6) ◽  
pp. 3051 ◽  
Author(s):  
M. R. Bari ◽  
R. J. Blaikie ◽  
F. Fang ◽  
A. Markwitz
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Silicon Nanostructures ◽  
Atomic Force Microscopy Study ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled

α,ω-Dihexylsexithiophene Self-Assembled Nanostructures on Mica: Atomic Force Microscopy Study

2012 ◽  
Vol 18 (4) ◽  
pp. 844-851 ◽  
Author(s):  
Li Wang ◽  
Shuhong Ye ◽  
Huizhen Yuan ◽  
Yonghai Song ◽  
Haozhi Zhu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Formation Mechanism ◽  
Molecular Conformation ◽  
Polar Solvent ◽  
Microscopy Study ◽  
Mica Surface ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force ◽  
Self Assembled

AbstractSelf-assembled nanostructures of α,ω-dihexylsexithiophene (DH6T) formed by spreading DH6T solutions onto freshly cleaved mica surface were studied by atomic force microscopy. The effects of solvent and concentration on the nanostructures of DH6T molecules were studied. Flat, well-ordered, and platelet-like domains were observed on mica surfaces after treatment with various polar solvent solutions of DH6T. These domains form a uniform film with height of 2.4 ± 0.2 nm, which is consistent with a 45° tilt in the molecular conformation of DH6T on mica surfaces. The formation mechanism of these multilayers is discussed in detail.

Conductive atomic force microscopy study of InGaN films grown by hot-wall epitaxy with a mixed (Ga+In) source

2000 ◽  
Vol 88 (3) ◽  
pp. 1670-1673 ◽  
Author(s):  
Futoshi Iwata ◽  
Shucheng Chu ◽  
Akira Sasaki ◽  
Kenji Ishino ◽  
Akihiro Ishida ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Hot Wall Epitaxy
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