Local stress determination in chromia-former thanks to micro-Raman spectroscopy: A way to investigate spontaneous delamination processes

2013 ◽  
Vol 113 (6) ◽  
pp. 063502 ◽  
Author(s):  
M. Guerain ◽  
P. Goudeau ◽  
B. Panicaud ◽  
J. L. Grosseau-Poussard
2000 ◽  
Vol 615 ◽  
Author(s):  
Ingrid De Wolf

ABSTRACTIn this paper, the different applications of Raman spectroscopy for the study of thin films is briefly discussed, using examples from microelectronics. Special attention is given to the application of micro-Raman spectroscopy for the measurement of local stress in and near films.


2010 ◽  
Vol 2010.8 (0) ◽  
pp. 255-256
Author(s):  
Akira TANIYAMA ◽  
Yoshikazu HIRAI ◽  
Koji SUGANO ◽  
Osamu TABATA ◽  
Tsuyoshi IKEHARA ◽  
...  

1997 ◽  
Vol 71 (17) ◽  
pp. 2520-2522 ◽  
Author(s):  
J. P. Landesman ◽  
A. Fiore ◽  
J. Nagle ◽  
V. Berger ◽  
E. Rosencher ◽  
...  

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