Quantitative determination of water coverage on KCl(001) by secondary ion mass spectroscopy

H. Kaarmann; H. Hoinkes; H. Wilsch

doi:10.1063/1.433713

Quantitative determination of water coverage on KCl(001) by secondary ion mass spectroscopy

The Journal of Chemical Physics ◽

10.1063/1.433713 ◽

1977 ◽

Vol 66 (10) ◽

pp. 4572-4576 ◽

Cited By ~ 10

Author(s):

H. Kaarmann ◽

H. Hoinkes ◽

H. Wilsch

Keyword(s):

Quantitative Determination ◽

Mass Spectroscopy ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion

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Quantitative determination of oxygen in silicon by combination of FTIR-spectroscopy, inert gas fusion analysis and secondary ion mass spectroscopy

Fresenius Zeitschrift für Analytische Chemie ◽

10.1007/bf00572379 ◽

1989 ◽

Vol 333 (4-5) ◽

pp. 576-582 ◽

Cited By ~ 16

Author(s):

G. Stingeder ◽

S. Gara ◽

S. Pahlke ◽

H. Schwenk ◽

E. Guerrero ◽

...

Keyword(s):

Quantitative Determination ◽

Ftir Spectroscopy ◽

Mass Spectroscopy ◽

Inert Gas ◽

Secondary Ion Mass Spectroscopy ◽

Fusion Analysis ◽

Secondary Ion

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Determination of Ca diffusion in YBCO films by Secondary Ion Mass Spectroscopy

Solid State Ionics ◽

10.1016/j.ssi.2003.08.052 ◽

2003 ◽

Vol 164 (3-4) ◽

pp. 149-158 ◽

Cited By ~ 11

Author(s):

A.V. Berenov ◽

S.R. Foltyn ◽

C.W. Schneider ◽

P.A. Warburton ◽

J.L. MacManus-Driscoll

Keyword(s):

Mass Spectroscopy ◽

Secondary Ion Mass Spectroscopy ◽

Ybco Films ◽

Secondary Ion

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Determination of the surface silanol concentration of amorphous silica surfaces using static secondary ion mass spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.580678 ◽

1997 ◽

Vol 15 (3) ◽

pp. 526-531 ◽

Cited By ~ 26

Author(s):

Andrew S. D’Souza ◽

Carlo G. Pantano ◽

Krishna M. R. Kallury

Keyword(s):

Mass Spectroscopy ◽

Amorphous Silica ◽

Secondary Ion Mass Spectroscopy ◽

Silica Surfaces ◽

Secondary Ion

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Determination of silicon oxide layer thickness by time-of-flight secondary ion mass spectroscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.590891 ◽

1999 ◽

Vol 17 (5) ◽

pp. 2191 ◽

Cited By ~ 5

Author(s):

O. Brox ◽

K. Iltgen ◽

S. Hellweg ◽

A. Benninghoven

Keyword(s):

Oxide Layer ◽

Layer Thickness ◽

Mass Spectroscopy ◽

Silicon Oxide ◽

Time Of Flight ◽

Oxide Layer Thickness ◽

Secondary Ion Mass Spectroscopy ◽

Silicon Oxide Layer ◽

Secondary Ion

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Determination of the Distribution of Sulphur in Wheat Starchy Endosperm Cells Using Secondary Ion Mass Spectroscopy (SIMS) Combined with Isotope Enhancement

Journal of Cereal Science ◽

10.1006/jcrs.2002.0511 ◽

2003 ◽

Vol 37 (3) ◽

pp. 311-318 ◽

Cited By ~ 9

Author(s):

K.A. Feeney ◽

P.J. Heard ◽

F.J. Zhao ◽

P.R. Shewry

Keyword(s):

Mass Spectroscopy ◽

Starchy Endosperm ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion

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Investigation on Determination of Titanium Precipitates in Steel by Secondary Ion Mass Spectroscopy

Tetsu-to-Hagane ◽

10.2355/tetsutohagane1955.77.11_2021 ◽

1991 ◽

Vol 77 (11) ◽

pp. 2021-2026 ◽

Cited By ~ 1

Author(s):

Kaoru SASAKAWA ◽

Tadashi TOYODA ◽

Sumio NAKAZAWA ◽

Gennai NORIO

Keyword(s):

Mass Spectroscopy ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion

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Gold and sulfur sources of the Taipingdong Carlin-type gold deposit: Constraints from simultaneous determination of sulfur isotopes and trace elements in pyrite using nanoscale secondary ion mass spectroscopy

Ore Geology Reviews ◽

10.1016/j.oregeorev.2019.103299 ◽

2020 ◽

Vol 117 ◽

pp. 103299 ◽

Cited By ~ 2

Author(s):

Jing Zhao ◽

Jinlong Liang ◽

Jie Li ◽

Yi Huang ◽

Xuemin Liu ◽

...

Keyword(s):

Trace Elements ◽

Simultaneous Determination ◽

Gold Deposit ◽

Mass Spectroscopy ◽

Sulfur Isotopes ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion

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Determination of trace metallic impurities on 200-mm silicon wafers by time-of-flight secondary-ion-mass spectroscopy

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.589577 ◽

1997 ◽

Vol 15 (6) ◽

pp. 1908 ◽

Cited By ~ 12

Author(s):

Paul K. Chu

Keyword(s):

Mass Spectroscopy ◽

Time Of Flight ◽

Silicon Wafers ◽

Secondary Ion Mass Spectroscopy ◽

Secondary Ion ◽

Metallic Impurities

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Secondary ion mass spectroscopy determination of oxygen diffusion coefficient in heavily Sb doped Si

Journal of Applied Physics ◽

10.1063/1.346311 ◽

1990 ◽

Vol 68 (7) ◽

pp. 3726-3728 ◽

Cited By ~ 12

Author(s):

M. Pagani

Keyword(s):

Diffusion Coefficient ◽

Mass Spectroscopy ◽

Oxygen Diffusion ◽

Secondary Ion Mass Spectroscopy ◽

Oxygen Diffusion Coefficient ◽

Secondary Ion

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Determination of Oxygen Pathway in Silver Cathodes by Secondary-Ion Mass Spectroscopy Using Oxygen Isotope Exchange

Journal of The Electrochemical Society ◽

10.1149/2.045111jes ◽

2011 ◽

Vol 158 (11) ◽

pp. B1380 ◽

Cited By ~ 2

Author(s):

Kazuya Sasaki ◽

Minoru Muranaka ◽

Akihiro Suzuki ◽

Takayuki Terai

Keyword(s):

Oxygen Isotope ◽

Mass Spectroscopy ◽

Isotope Exchange ◽

Secondary Ion Mass Spectroscopy ◽

Oxygen Isotope Exchange ◽

Silver Cathodes ◽

Secondary Ion

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