Kinetic study of atomic hydrogen etching of GaAs (100)

1995 ◽  
Vol 77 (5) ◽  
pp. 2155-2159 ◽  
Author(s):  
John W. Elzey ◽  
Paul F. A. Meharg ◽  
Elmer A. Ogryzlo
2003 ◽  
Vol 10 (01) ◽  
pp. 55-63 ◽  
Author(s):  
M. DIANI ◽  
J. DIOURI ◽  
L. KUBLER ◽  
L. SIMON ◽  
D. AUBEL ◽  
...  

In 6H- or 4H-SiC(0001) surface technology, a Si-rich 3 × 3 reconstruction is usually first prepared by heating at 800°C under Si flux, and two other most stable [Formula: see text] or [Formula: see text] reconstructions are obtained by further extensive annealing at higher temperatures ranging between 900 and 1250°C. The 3 × 3 Si excess is thus progressively depleted up to a graphitized C-rich surface. By crystallographic (LEED) and chemical surface characterizations (XPS and UPS), we show that all these reconstructions can be obtained at a unique, low formation temperature of 800°C if the Si richness is controlled before annealing. This control is achieved by exposing the 3 × 3 surface to atomic hydrogen at room temperature. This procedure allows one to etch or partially deplete the (3 × 3)-associated Si excess, and make it more comparable to the final Si coverages, required to form the less Si-rich [Formula: see text] or [Formula: see text] reconstructions. After annealing at 800°C, the latter reconstructions are no longer determined by the heating time or temperature but only by the initial Si coverage set by the H doses inducing the low temperature etching. The high temperature treatment, required to remove by sublimation a significant Si amount associated with the Si-rich 3 × 3 reconstruction, is thus avoided. Such a methodology could be applied to other binary systems in the formation of reconstructions that depends on surface richness.


2021 ◽  
Vol 92 (6) ◽  
pp. 063518
Author(s):  
D. P. J. van Leuken ◽  
C. A. de Meijere ◽  
R. van der Horst ◽  
V. Y. Banine ◽  
E. A. Osorio ◽  
...  

2008 ◽  
Vol 451 (1-3) ◽  
pp. 8-13 ◽  
Author(s):  
Yide Gao ◽  
Kimberly Fessel ◽  
Chris McLeod ◽  
Paul Marshall

2006 ◽  
Vol 600 (11) ◽  
pp. 2288-2292 ◽  
Author(s):  
J. Zhang ◽  
S.G. Turner ◽  
S.Y. Chiam ◽  
R. Liu ◽  
E.S. Tok ◽  
...  

2011 ◽  
Vol 258 (1) ◽  
pp. 7-12 ◽  
Author(s):  
Juequan Chen ◽  
Eric Louis ◽  
Rob Harmsen ◽  
Tim Tsarfati ◽  
Herbert Wormeester ◽  
...  

1991 ◽  
Vol 70 (6) ◽  
pp. 2954-2957 ◽  
Author(s):  
P. J. Chen ◽  
M. L. Colaianni ◽  
J. T. Yates

2009 ◽  
Vol 18 (5-8) ◽  
pp. 831-834 ◽  
Author(s):  
H. Nakazawa ◽  
H. Sugita ◽  
Y. Enta ◽  
M. Suemitsu ◽  
K. Yasui ◽  
...  

2015 ◽  
Vol 91 (20) ◽  
Author(s):  
Roozbeh Shokri ◽  
Holger L. Meyerheim ◽  
Sumalay Roy ◽  
Katayoon Mohseni ◽  
A. Ernst ◽  
...  

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