Inhibition of atomic hydrogen etching of Si(111) by boron doping

1991 ◽  
Vol 70 (6) ◽  
pp. 2954-2957 ◽  
Author(s):  
P. J. Chen ◽  
M. L. Colaianni ◽  
J. T. Yates
2003 ◽  
Vol 10 (01) ◽  
pp. 55-63 ◽  
Author(s):  
M. DIANI ◽  
J. DIOURI ◽  
L. KUBLER ◽  
L. SIMON ◽  
D. AUBEL ◽  
...  

In 6H- or 4H-SiC(0001) surface technology, a Si-rich 3 × 3 reconstruction is usually first prepared by heating at 800°C under Si flux, and two other most stable [Formula: see text] or [Formula: see text] reconstructions are obtained by further extensive annealing at higher temperatures ranging between 900 and 1250°C. The 3 × 3 Si excess is thus progressively depleted up to a graphitized C-rich surface. By crystallographic (LEED) and chemical surface characterizations (XPS and UPS), we show that all these reconstructions can be obtained at a unique, low formation temperature of 800°C if the Si richness is controlled before annealing. This control is achieved by exposing the 3 × 3 surface to atomic hydrogen at room temperature. This procedure allows one to etch or partially deplete the (3 × 3)-associated Si excess, and make it more comparable to the final Si coverages, required to form the less Si-rich [Formula: see text] or [Formula: see text] reconstructions. After annealing at 800°C, the latter reconstructions are no longer determined by the heating time or temperature but only by the initial Si coverage set by the H doses inducing the low temperature etching. The high temperature treatment, required to remove by sublimation a significant Si amount associated with the Si-rich 3 × 3 reconstruction, is thus avoided. Such a methodology could be applied to other binary systems in the formation of reconstructions that depends on surface richness.


2021 ◽  
Vol 92 (6) ◽  
pp. 063518
Author(s):  
D. P. J. van Leuken ◽  
C. A. de Meijere ◽  
R. van der Horst ◽  
V. Y. Banine ◽  
E. A. Osorio ◽  
...  

1995 ◽  
Vol 77 (5) ◽  
pp. 2155-2159 ◽  
Author(s):  
John W. Elzey ◽  
Paul F. A. Meharg ◽  
Elmer A. Ogryzlo

2006 ◽  
Vol 600 (11) ◽  
pp. 2288-2292 ◽  
Author(s):  
J. Zhang ◽  
S.G. Turner ◽  
S.Y. Chiam ◽  
R. Liu ◽  
E.S. Tok ◽  
...  

2011 ◽  
Vol 258 (1) ◽  
pp. 7-12 ◽  
Author(s):  
Juequan Chen ◽  
Eric Louis ◽  
Rob Harmsen ◽  
Tim Tsarfati ◽  
Herbert Wormeester ◽  
...  

1994 ◽  
Vol 364 ◽  
Author(s):  
T. K. Chaki

AbstractA minute amount of boron doping in polycrystalline Ni3Al can suppress embrit-tlement due to environmental moisture. However, B is ineffective in suppressing hydrogen embrittlement due to cathodic charging. A mechanism is proposed to explain this seemingly contradictory dichotomy. Grain boundaries in B-free Ni3Al contain crack-like microcavities, to the tips of which atomic hydrogen, generated by the reaction of moisture with Al, can diffuse and cause embrittlement. In B-doped Ni3Al interstitial B atoms interact with Ni atoms and reduce the strength of directional bonding between Ni and Al atoms, such that the atoms can relax easily to close up the microcavities, thereby reducing environmental embrittlement. In the presence of a large amount of hydrogen, introduced by cathodic charging, microcracks can be nucleated in B-doped Ni3Al by hydrogen-enhanced dislocation activity, and then hydrogen embrittlement can proceed by enhanced plasticity at the crack tips.


2009 ◽  
Vol 18 (5-8) ◽  
pp. 831-834 ◽  
Author(s):  
H. Nakazawa ◽  
H. Sugita ◽  
Y. Enta ◽  
M. Suemitsu ◽  
K. Yasui ◽  
...  

2015 ◽  
Vol 91 (20) ◽  
Author(s):  
Roozbeh Shokri ◽  
Holger L. Meyerheim ◽  
Sumalay Roy ◽  
Katayoon Mohseni ◽  
A. Ernst ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document