Effects of high field electron injection into the gate oxide ofP‐channel metal–oxide–semiconductor transistors
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1995 ◽
Vol 34
(Part 1, No. 2B)
◽
pp. 969-972
◽
1996 ◽
Vol 35
(Part 1, No. 2B)
◽
pp. 812-817
◽
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Keyword(s):