Charging and discharging properties of electron traps created by hot‐carrier injections in gate oxide ofn‐channel metal oxide semiconductor field effect transistor
Keyword(s):
2005 ◽
Vol 44
(8)
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pp. 5889-5892
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1990 ◽
Vol 29
(Part 2, No. 12)
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pp. L2286-L2288
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Keyword(s):
2010 ◽
Vol 49
(12)
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pp. 128002
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Keyword(s):
2020 ◽
Vol 118
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pp. 113803
2000 ◽
Vol 39
(Part 2, No. 1A/B)
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pp. L28-L30