Ionized impurity scattering in Monte Carlo calculations

1986 ◽  
Vol 59 (3) ◽  
pp. 813-815 ◽  
Author(s):  
T. G. Van de Roer ◽  
F. P. Widdershoven
VLSI Design ◽  
1998 ◽  
Vol 6 (1-4) ◽  
pp. 209-212
Author(s):  
G. Kaiblinger-Grujin ◽  
H. Kosina

The well known Brooks-Herring (BH) formula for charged-impurity (CI) scattering overestimates the mobility of electrons in highly doped semiconductors. The BH approach relies on a static, single-site description of the carrier-impurity interactions neglecting many-particle effects. We propose a physically based charged-impurity scattering model including Fermi- Dirac statistics, dispersive screening, and two-ion scattering. An approximation for the dielectric function is made to avoid numerical integrations. The resulting scattering rate formulas are analytical. Monte Carlo calculations were performed for majority electrons in bulk silicon at 300 K with impurity concentrations from 1015 cm–3 to 1021 cm–3.


2011 ◽  
Vol 312-315 ◽  
pp. 122-126
Author(s):  
Mebarka Daoudi ◽  
Abderrahmane Belghachi ◽  
Luca Varani ◽  
Christophe Palermo

In this paper, the transport properties of Hg0.8Cd0.2Te have been investigated at 77 K using the hydrodynamic model. We remarked that ionized impurity scattering mechanism plays a dominant role in this material at low electric field. The drift velocity, mean energy and drift mobility are determined as functions of the electric field strength. Comparison is made with Monte Carlo calculations and experimental results. The obtained velocity-field curve is in good agreement with reported experimental data.


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