Charge pumping measurements on stepped‐gate metal‐nitride‐oxide‐silicon memory transistors
2010 ◽
Vol 28
(4)
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pp. 829-833
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1970 ◽
Vol 58
(8)
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pp. 1207-1219
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1978 ◽
Vol 25
(6)
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pp. 1613-1618
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Keyword(s):
Keyword(s):
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1997 ◽
Vol 16
(3)
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pp. 160-162
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Keyword(s):