A new sample holder for laser-excited pump-probe magnetic measurements on a Focus photoelectron emission microscope
2008 ◽
Vol 79
(3)
◽
pp. 033702
◽
2012 ◽
Vol 83
(6)
◽
pp. 066106
◽
Keyword(s):
Local electronic structure analysis using a photoelectron emission microscope (PEEM) with hard X-ray
2006 ◽
Vol 4
◽
pp. 490-493
◽
2001 ◽
Vol 25
(4−2)
◽
pp. 1059-1062
◽